尾上研究室 研究業績一覧: D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, Static Voltage Over-Scaling and Dynamic Voltage Variation Tolerance with Replica Circuits and Time Redundancy in Reconfigurable Devices, December 2012.
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D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Static Voltage Over-Scaling and Dynamic Voltage Variation Tolerance with Replica Circuits and Time Redundancy in Reconfigurable Devices," Proceedings of International Conference on ReConFigurable Computing and FPGAs (ReConFig), December 2012.
ID 652
分類 国際会議
タグ
表題 (title) Static Voltage Over-Scaling and Dynamic Voltage Variation Tolerance with Replica Circuits and Time Redundancy in Reconfigurable Devices
表題 (英文)
著者名 (author) D. Alnajjar,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author)
キー (key)
定期刊行物名 (journal) Proceedings of International Conference on ReConFigurable Computing and FPGAs (ReConFig)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 12
出版年 (year) 2012
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id652,
         title = {Static Voltage Over-scaling and Dynamic Voltage Variation Tolerance with Replica Circuits and Time Redundancy in Reconfigurable Devices},
        author = {D. Alnajjar and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {Proceedings of International Conference on ReConFigurable Computing and FPGAs (ReConFig)},
         month = {12},
          year = {2012},
}
  

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