尾上研究室 研究業績一覧: K. Shinkai, M. Hashimoto, and T. Onoye, Extracting Device-Parameter Variations with Ro-Based Sensors, March 2011.
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K. Shinkai, M. Hashimoto, and T. Onoye, "Extracting Device-Parameter Variations with Ro-Based Sensors," In ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 13--18, March 2011.
ID 589
分類 国際会議
タグ
表題 (title) Extracting Device-Parameter Variations with Ro-Based Sensors
表題 (英文)
著者名 (author) K. Shinkai,M. Hashimoto,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key)
書籍・会議録表題 (booktitle) ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 13--18
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 3
出版年 (year) 2011
採択率 (acceptance)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@inproceedings{id589,
         title = {Extracting Device-Parameter Variations with RO-Based Sensors},
        author = {K. Shinkai and M. Hashimoto and T. Onoye},
     booktitle = {ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)},
         pages = {13--18},
         month = {3},
          year = {2011},
}
  

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