尾上研究室 研究業績一覧: Z. Huang, A. Kurokawa, M. Hashimoto, T. Sato, M. Jiang, and Y. Inoue, Modeling the Overshooting Effect for Cmos Inverter Delay Analysis in Nanometer Technologies, February 2010.
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Z. Huang, A. Kurokawa, M. Hashimoto, T. Sato, M. Jiang, and Y. Inoue, "Modeling the Overshooting Effect for Cmos Inverter Delay Analysis in Nanometer Technologies," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems , 29(2), pp. 250--260, February 2010.
ID 559
分類 論文誌
タグ
表題 (title) Modeling the Overshooting Effect for Cmos Inverter Delay Analysis in Nanometer Technologies
表題 (英文)
著者名 (author) Z. Huang,A. Kurokawa,M. Hashimoto,T. Sato,M. Jiang,Y. Inoue
英文著者名 (author)
キー (key)
定期刊行物名 (journal) IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
定期刊行物名 (英文)
巻数 (volume) 29
号数 (number) 2
ページ範囲 (pages) 250--260
刊行月 (month) 2
出版年 (year) 2010
Impact Factor (JCR)
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付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id559,
         title = {Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies},
        author = {Z. Huang and A. Kurokawa and M. Hashimoto and T. Sato and M. Jiang and Y. Inoue},
       journal = {IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems },
        volume = {29},
        number = {2},
         pages = {250--260},
         month = {2},
          year = {2010},
}
  

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