尾上研究室 研究業績一覧: H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, Transistor Variability Modeling and Its Validation with Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits, July 2010.
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H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Transistor Variability Modeling and Its Validation with Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits," IEEE Transactions on VLSI Systems, 18(7), pp. 1118--1129, July 2010.
ID 557
分類 論文誌
タグ
表題 (title) Transistor Variability Modeling and Its Validation with Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits
表題 (英文)
著者名 (author) H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye
英文著者名 (author)
キー (key)
定期刊行物名 (journal) IEEE Transactions on VLSI Systems
定期刊行物名 (英文)
巻数 (volume) 18
号数 (number) 7
ページ範囲 (pages) 1118--1129
刊行月 (month) 7
出版年 (year) 2010
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付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id557,
         title = {Transistor Variability Modeling and Its Validation with Ring-oscillation Frequencies for Body-biased Subthreshold Circuits},
        author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
       journal = {IEEE Transactions on VLSI Systems},
        volume = {18},
        number = {7},
         pages = {1118--1129},
         month = {7},
          year = {2010},
}
  

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