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| S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, "Characterizing Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4-V Srams," IEEE Transactions on Nuclear Science, April 2015. | |
| ID | 800 |
| 分類 | 論文誌 |
| タグ | |
| 表題 (title) |
Characterizing Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4-V Srams |
| 表題 (英文) |
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| 著者名 (author) |
S. Hirokawa,R. Harada,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
4 |
| 出版年 (year) |
2015 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id800,
title = {Characterizing alpha- and neutron-induced SEU and MCU on SOTB and bulk 0.4-V SRAMs},
author = {S. Hirokawa and R. Harada and M. Hashimoto and T. Onoye},
journal = {IEEE Transactions on Nuclear Science},
month = {4},
year = {2015},
}
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