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| M. Hashimoto, "Toward Robust Subthreshold Circuit Design: Variability and Soft Error Perspective (Invited)," Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), October 2014. | |
| ID | 767 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Toward Robust Subthreshold Circuit Design: Variability and Soft Error Perspective (Invited) |
| 表題 (英文) |
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| 著者名 (author) |
M. Hashimoto |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
10 |
| 出版年 (year) |
2014 |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id767,
title = {Toward Robust Subthreshold Circuit Design: Variability and Soft Error Perspective (Invited)},
author = {M. Hashimoto},
journal = {Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)},
month = {10},
year = {2014},
}
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