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| H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10t Subthreshold Sram," IEEE Transactions on Device and Materials Reliability, 14(1), 463 -- 470, March 2014. | |
| ID | 760 |
| 分類 | 論文誌 |
| タグ | |
| 表題 (title) |
Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10t Subthreshold Sram |
| 表題 (英文) |
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| 著者名 (author) |
H. Fuketa,R. Harada,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
IEEE Transactions on Device and Materials Reliability |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
14 |
| 号数 (number) |
1 |
| ページ範囲 (pages) |
463 -- 470 |
| 刊行月 (month) |
3 |
| 出版年 (year) |
2014 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id760,
title = {Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM},
author = {H. Fuketa and R. Harada and M. Hashimoto and T. Onoye},
journal = {IEEE Transactions on Device and Materials Reliability},
volume = {14},
number = {1},
pages = {463 -- 470},
month = {3},
year = {2014},
}
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