尾上研究室 研究業績一覧: H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10t Subthreshold Sram, March 2014.
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H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10t Subthreshold Sram," IEEE Transactions on Device and Materials Reliability, 14(1), 463 -- 470, March 2014.
ID 760
分類 論文誌
タグ
表題 (title) Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10t Subthreshold Sram
表題 (英文)
著者名 (author) H. Fuketa,R. Harada,M. Hashimoto,T. Onoye
英文著者名 (author)
キー (key)
定期刊行物名 (journal) IEEE Transactions on Device and Materials Reliability
定期刊行物名 (英文)
巻数 (volume) 14
号数 (number) 1
ページ範囲 (pages) 463 -- 470
刊行月 (month) 3
出版年 (year) 2014
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id760,
         title = {Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM},
        author = {H. Fuketa and R. Harada and M. Hashimoto and T. Onoye},
       journal = {IEEE Transactions on Device and Materials Reliability},
        volume = {14},
        number = {1},
         pages = {463 -- 470},
         month = {3},
          year = {2014},
}
  

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