尾上研究室 研究業績一覧: T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, Scaling Trend of Sram and Ff of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk Cmos Technology, July 2013.
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T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Scaling Trend of Sram and Ff of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk Cmos Technology," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.
ID 730
分類 国際会議
タグ
表題 (title) Scaling Trend of Sram and Ff of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk Cmos Technology
表題 (英文)
著者名 (author) T. Uemura,T. Kato,H. Matsuyama,M. Hashimoto
英文著者名 (author)
キー (key)
定期刊行物名 (journal) IEEE Nuclear and Space Radiation Effects Conference (NSREC)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 7
出版年 (year) 2013
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id730,
         title = {Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor reliability on Bulk CMOS Technology},
        author = {T. Uemura and T. Kato and H. Matsuyama and M. Hashimoto},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2013},
}
  

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