| Tweet | |
| T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Scaling Trend of Sram and Ff of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk Cmos Technology," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013. | |
| ID | 730 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Scaling Trend of Sram and Ff of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk Cmos Technology |
| 表題 (英文) |
|
| 著者名 (author) |
T. Uemura,T. Kato,H. Matsuyama,M. Hashimoto |
| 英文著者名 (author) |
|
| キー (key) |
|
| 定期刊行物名 (journal) |
IEEE Nuclear and Space Radiation Effects Conference (NSREC) |
| 定期刊行物名 (英文) |
|
| 巻数 (volume) |
|
| 号数 (number) |
|
| ページ範囲 (pages) |
|
| 刊行月 (month) |
7 |
| 出版年 (year) |
2013 |
| Impact Factor (JCR) |
|
| URL |
|
| 付加情報 (note) |
|
| 注釈 (annote) |
|
| 内容梗概 (abstract) |
|
| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id730,
title = {Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor reliability on Bulk CMOS Technology},
author = {T. Uemura and T. Kato and H. Matsuyama and M. Hashimoto},
journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
month = {7},
year = {2013},
}
|