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| D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Pvt-Induced Timing Error Detection Through Replica Circuits and Time Redundancy in Reconfigurable Devices," IEICE Electronics Express (ELEX), 10(5), April 2013. | |
| ID | 725 |
| 分類 | 論文誌 |
| タグ | |
| 表題 (title) |
Pvt-Induced Timing Error Detection Through Replica Circuits and Time Redundancy in Reconfigurable Devices |
| 表題 (英文) |
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| 著者名 (author) |
D. Alnajjar,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
IEICE Electronics Express (ELEX) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
10 |
| 号数 (number) |
5 |
| ページ範囲 (pages) |
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| 刊行月 (month) |
4 |
| 出版年 (year) |
2013 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id725,
title = {PVT-induced Timing Error Detection through Replica Circuits and Time Redundancy in Reconfigurable Devices},
author = {D. Alnajjar and Y. Mitsuyama and M. Hashimoto and T. Onoye},
journal = {IEICE Electronics Express (ELEX)},
volume = {10},
number = {5},
month = {4},
year = {2013},
}
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