尾上研究室 研究業績一覧: Y. Takai, Y. Ogasahara, M. Hashimoto, and T. Onoye, Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to Sso, May 2010.
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Y. Takai, Y. Ogasahara, M. Hashimoto, and T. Onoye, "Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to Sso," In Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI), pp. 19--20, May 2010.
ID 595
分類 国際会議
タグ
表題 (title) Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to Sso
表題 (英文)
著者名 (author) Y. Takai,Y. Ogasahara,M. Hashimoto,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key)
書籍・会議録表題 (booktitle) Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 19--20
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 5
出版年 (year) 2010
採択率 (acceptance)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@inproceedings{id595,
         title = {Measurement of On-chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase due to SSO },
        author = {Y. Takai and Y. Ogasahara and M. Hashimoto and T. Onoye},
     booktitle = {Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI)},
         pages = {19--20},
         month = {5},
          year = {2010},
}
  

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