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| H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram," In Proceedings of International Reliability Physics Symposium (IRPS), pp. 213--217, May 2010. | |
| ID | 594 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram |
| 表題 (英文) |
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| 著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
| 英文著者名 (author) |
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| 編者名 (editor) |
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| 編者名 (英文) |
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| キー (key) |
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| 書籍・会議録表題 (booktitle) |
Proceedings of International Reliability Physics Symposium (IRPS) |
| 書籍・会議録表題(英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
213--217 |
| 組織名 (organization) |
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| 出版元 (publisher) |
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| 出版元 (英文) |
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| 出版社住所 (address) |
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| 刊行月 (month) |
5 |
| 出版年 (year) |
2010 |
| 採択率 (acceptance) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@inproceedings{id594,
title = {Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM},
author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
booktitle = {Proceedings of International Reliability Physics Symposium (IRPS)},
pages = {213--217},
month = {5},
year = {2010},
}
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