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H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram," In Proceedings of International Reliability Physics Symposium (IRPS), pp. 213--217, May 2010. | |
ID | 594 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram |
表題 (英文) |
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著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
英文著者名 (author) |
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編者名 (editor) |
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編者名 (英文) |
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キー (key) |
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書籍・会議録表題 (booktitle) |
Proceedings of International Reliability Physics Symposium (IRPS) |
書籍・会議録表題(英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
213--217 |
組織名 (organization) |
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出版元 (publisher) |
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出版元 (英文) |
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出版社住所 (address) |
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刊行月 (month) |
5 |
出版年 (year) |
2010 |
採択率 (acceptance) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@inproceedings{id594, title = {Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM}, author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye}, booktitle = {Proceedings of International Reliability Physics Symposium (IRPS)}, pages = {213--217}, month = {5}, year = {2010}, } |