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D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Mttf Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability," In IEEE Workshop on Silicon Errors in Logic - System Effects, March 2011. | |
ID | 590 |
分類 | 国際会議 |
タグ | |
表題 (title) |
Mttf Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability |
表題 (英文) |
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著者名 (author) |
D. Alnajjar,H. Kounoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
英文著者名 (author) |
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編者名 (editor) |
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編者名 (英文) |
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キー (key) |
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書籍・会議録表題 (booktitle) |
IEEE Workshop on Silicon Errors in Logic - System Effects |
書籍・会議録表題(英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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組織名 (organization) |
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出版元 (publisher) |
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出版元 (英文) |
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出版社住所 (address) |
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刊行月 (month) |
3 |
出版年 (year) |
2011 |
採択率 (acceptance) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@inproceedings{id590, title = {MTTF Measurement Under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability}, author = {D. Alnajjar and H. Kounoura and Y. Mitsuyama and M. Hashimoto and T. Onoye}, booktitle = {IEEE Workshop on Silicon Errors in Logic - System Effects}, month = {3}, year = {2011}, } |