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K. Shinkai, M. Hashimoto, and T. Onoye, "Prediction of Self-Heating in Short Intra-Block Wires," IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, E93-A(3), pp. 583-594, March 2010. | |
ID | 501 |
分類 | 論文誌 |
タグ | |
表題 (title) |
Prediction of Self-Heating in Short Intra-Block Wires |
表題 (英文) |
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著者名 (author) |
K. Shinkai,M. Hashimoto,T. Onoye |
英文著者名 (author) |
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キー (key) |
Ken-ichi(Kenichi) Shinkai, Masanori Hashimoto, Takao Onoye |
定期刊行物名 (journal) |
IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences |
定期刊行物名 (英文) |
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巻数 (volume) |
E93-A |
号数 (number) |
3 |
ページ範囲 (pages) |
583-594 |
刊行月 (month) |
3 |
出版年 (year) |
2010 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
This paper investigates whether the self-heating effect in short intra-block wires will become apparent with technology scaling. These wires seem to have good thermal radiation characteristics, but we validate that the self-heating effect in local signal wires will be greater than that in optimal repeater-inserted global wires. Our numerical experiment shows that the maximum temperature increase from the silicon junction temperature will reach 40.4C in a steady state at a 14-nm process. Our attribution analysis also demonstrates that miniaturizing the area of wire cross-section exacerbates self-heating as well as using low-k material and increased power dissipation in advanced technologies below 28 nm. It is revealed that the impact of self-heating on performance in local wires is limited, while underestimating the temperature may cause an unexpected reliability failure. |
論文電子ファイル | 2.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id501, title = {Prediction of Self-Heating in Short Intra-Block Wires}, author = {K. Shinkai and M. Hashimoto and T. Onoye}, journal = {IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences}, volume = {E93-A}, number = {3}, pages = {583-594}, month = {3}, year = {2010}, } |