Detail of a work
K. Shinkai, M. Hashimoto, and T. Onoye, "Prediction of Self-Heating in Short Intra-Block Wires," IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, E93-A(3), pp. 583-594, March 2010.
ID 501
分類 論文誌
タグ
表題 (title) Prediction of Self-Heating in Short Intra-Block Wires
表題 (英文)
著者名 (author) K. Shinkai,M. Hashimoto,T. Onoye
英文著者名 (author)
キー (key) Ken-ichi(Kenichi) Shinkai, Masanori Hashimoto, Takao Onoye
定期刊行物名 (journal) IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences
定期刊行物名 (英文)
巻数 (volume) E93-A
号数 (number) 3
ページ範囲 (pages) 583-594
刊行月 (month) 3
出版年 (year) 2010
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract) This paper investigates whether the self-heating effect in short intra-block wires will become apparent with technology scaling.
These wires seem to have good thermal radiation characteristics,
but we validate that the self-heating effect in local signal wires will be greater than that in optimal repeater-inserted global wires.
Our numerical experiment shows that the maximum temperature increase from the silicon junction temperature will reach 40.4C in a steady state at a 14-nm process.
Our attribution analysis also demonstrates that miniaturizing the area of wire cross-section
exacerbates self-heating as well as using low-k material and increased power dissipation in advanced technologies below 28 nm.
It is revealed that the impact of self-heating on performance in local wires is limited,
while underestimating the temperature may cause an unexpected reliability failure.
論文電子ファイル 2.pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ 
@article{id501,
         title = {Prediction of Self-Heating in Short Intra-Block Wires},
        author = {K. Shinkai and M. Hashimoto and T. Onoye},
       journal = {IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {E93-A},
        number = {3},
         pages = {583-594},
         month = {3},
          year = {2010},
}