尾上研究室 研究業績一覧: H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, Comparative Study on Delay Degrading Estimation Due to Nbti with Circuit/Instance/Transistor-Level Stress Probability Consideration, March 2010.
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H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to Nbti with Circuit/Instance/Transistor-Level Stress Probability Consideration," In Proc. International Symposium on Quality Electronic Design (ISQED), pp. 646-651, March 2010.
ID 499
分類 国際会議
タグ
表題 (title) Comparative Study on Delay Degrading Estimation Due to Nbti with Circuit/Instance/Transistor-Level Stress Probability Consideration
表題 (英文)
著者名 (author) H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Hiroaki Konoura, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye
書籍・会議録表題 (booktitle) Proc. International Symposium on Quality Electronic Design (ISQED)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 646-651
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 3
出版年 (year) 2010
採択率 (acceptance)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract) NBTI degradation proceeds while a negative bias
is applied to the gate of PMOS, whereas it recovers while a pos-
itive bias is applied. Therefore, PMOS stress (ON) probability
has a strong impact on circuit timing degradation due to NBTI
effect. This paper evaluates how the granularity of stress prob-
ability calculation affects NBTI prediction using the state-of-
the-art long term prediction model. Experimental results show
that the prediction accuracy of timing degradation due to NBTI
effect is heavily dependent on granularity of stress probability
consideration in timing analysis.
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BiBTeXエントリ
@inproceedings{id499,
         title = {Comparative study on delay degrading estimation due to NBTI with circuit/instance/transistor-level stress probability consideration},
        author = {H. Konoura and Y. Mitsuyama and M. Hashimoto and T. Onoye},
     booktitle = {Proc. International Symposium on Quality Electronic Design (ISQED)},
         pages = {646-651},
         month = {3},
          year = {2010},
}
  

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