| Tweet | |
| H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to Nbti with Circuit/Instance/Transistor-Level Stress Probability Consideration," In Proc. International Symposium on Quality Electronic Design (ISQED), pp. 646-651, March 2010. | |
| ID | 499 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Comparative Study on Delay Degrading Estimation Due to Nbti with Circuit/Instance/Transistor-Level Stress Probability Consideration |
| 表題 (英文) |
|
| 著者名 (author) |
H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
|
| 編者名 (editor) |
|
| 編者名 (英文) |
|
| キー (key) |
Hiroaki Konoura, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye |
| 書籍・会議録表題 (booktitle) |
Proc. International Symposium on Quality Electronic Design (ISQED) |
| 書籍・会議録表題(英文) |
|
| 巻数 (volume) |
|
| 号数 (number) |
|
| ページ範囲 (pages) |
646-651 |
| 組織名 (organization) |
|
| 出版元 (publisher) |
|
| 出版元 (英文) |
|
| 出版社住所 (address) |
|
| 刊行月 (month) |
3 |
| 出版年 (year) |
2010 |
| 採択率 (acceptance) |
|
| URL |
|
| 付加情報 (note) |
|
| 注釈 (annote) |
|
| 内容梗概 (abstract) |
NBTI degradation proceeds while a negative bias is applied to the gate of PMOS, whereas it recovers while a pos- itive bias is applied. Therefore, PMOS stress (ON) probability has a strong impact on circuit timing degradation due to NBTI effect. This paper evaluates how the granularity of stress prob- ability calculation affects NBTI prediction using the state-of- the-art long term prediction model. Experimental results show that the prediction accuracy of timing degradation due to NBTI effect is heavily dependent on granularity of stress probability consideration in timing analysis. |
| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@inproceedings{id499,
title = {Comparative study on delay degrading estimation due to NBTI with circuit/instance/transistor-level stress probability consideration},
author = {H. Konoura and Y. Mitsuyama and M. Hashimoto and T. Onoye},
booktitle = {Proc. International Symposium on Quality Electronic Design (ISQED)},
pages = {646-651},
month = {3},
year = {2010},
}
|