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| K. Shinkai and M. Hashimoto, "A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability," In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 79-84, February 2009. | |
| ID | 469 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability |
| 表題 (英文) |
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| 著者名 (author) |
K. Shinkai,M. Hashimoto |
| 英文著者名 (author) |
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| 編者名 (editor) |
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| 編者名 (英文) |
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| キー (key) |
Kenichi(Ken-ichi) Shinkai, Masanori Hashimoto |
| 書籍・会議録表題 (booktitle) |
Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU) |
| 書籍・会議録表題(英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
79-84 |
| 組織名 (organization) |
ACM/IEEE |
| 出版元 (publisher) |
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| 出版元 (英文) |
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| 出版社住所 (address) |
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| 刊行月 (month) |
2 |
| 出版年 (year) |
2009 |
| 採択率 (acceptance) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
This paper proposes a gate delay model suitable for timing analysis considering wide-ranging process and environmental variability. We focus on current variation and consider its impact on delay by replacing the output load. Our model can be used in both statistical timing analysis and corner-based timing analysis. We improve the accuracy of our preliminary model by innovating the estimation of the input voltage at the timing when the output voltage goes across half of the supply voltage. We also reduce the delay estimation error by improving the estimation of transition starting time. Experimental results in a 90-nm technology show that these techniques reduce the RMS error from 9.35% in our preliminary work to 5.19%. Our model can calculate the sensitivity for statistical analysis on the fly even in the case that the nominal operating condition changes, and the error of the standard deviation is reduced from -22.7% to 1.6% using updated sensitivities in a test case. |
| 論文電子ファイル | 2.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@inproceedings{id469,
title = {A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability},
author = {K. Shinkai and M. Hashimoto},
booktitle = {Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)},
pages = {79-84},
organization = {ACM/IEEE},
month = {2},
year = {2009},
}
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