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| Y. Ogasahara, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Inductive Coupling Noise in 90nm Global Interconnects," IEEE Journal of Solid-State Circuits, 43(3), pp. 718-728, March 2008. | |
| ID | 445 |
| 分類 | 論文誌 |
| タグ | |
| 表題 (title) |
Measurement and Analysis of Inductive Coupling Noise in 90nm Global Interconnects |
| 表題 (英文) |
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| 著者名 (author) |
Y. Ogasahara,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
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| キー (key) |
Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye |
| 定期刊行物名 (journal) |
IEEE Journal of Solid-State Circuits |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
43 |
| 号数 (number) |
3 |
| ページ範囲 (pages) |
718-728 |
| 刊行月 (month) |
3 |
| 出版年 (year) |
2008 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id445,
title = {Measurement and Analysis of Inductive Coupling Noise in 90nm Global Interconnects},
author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
journal = {IEEE Journal of Solid-State Circuits},
volume = {43},
number = {3},
pages = {718-728},
month = {3},
year = {2008},
}
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