論文誌

[1] S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, "Characterizing Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4-V Srams," IEEE Transactions on Nuclear Science, April 2015.

[2] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Set Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1461--1467, July 2014.

[3] H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10t Subthreshold Sram," IEEE Transactions on Device and Materials Reliability, volume 14, number 1, 463 -- 470, March 2014.

[4] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Impact of NBTI-Induced Pulse-Width Modulation on SET Pulse-Width Measurement," IEEE Transactions on Nuclear Science, volume 60, number 4, pages 2630--2634, August 2013.

[5] R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, "Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram," IEEE Transactions on Nuclear Science, volume 59, number 6, pages 2791--2795, December 2012.

[6] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution," IEICE Transaction on Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 12, pages 2417-2423, December 2010. [2.pdf]

国際会議

[1] S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced Seu and Mcu Rate Characterization and Analysis of Sotb and Bulk Srams at 0.3v Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.

[2] R. Harada, S. Hirokawa, and M. Hashimoto, "Measurement of Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4 V Srams," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.

[3] R. Harada, M. Hashimoto, and T. Onoye, "Nbti Characterization Using Pulse-Width Modulation," IEEE/ACM Workshop on Variability Modeling and Characterization, November 2013.

[4] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Impact of Nbti-­Induced Pulse-Width Modulation on Set Pulse-Width Measurement," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2012.

[5] R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, "Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram," IEEE Nuclear and Space Radiation Effects Conference, July 2012.

[6] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Set Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects," Proceedings of International Reliability Physics Symposium (IRPS), April 2012.

[7] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Neutron Induced Single Event Multiple Transients with Voltage Scaling and Body Biasing," In Proc. International Reliability Physics Symposium (IRPS), April 2011.

[8] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution," In Proc. International Symposium on Quality Electronic Design (ISQED), March 2010. [2.pdf]