国際会議

[1] Y. Konno, K. Nakamura, T. Bitoh, K. Saga, and S. Yano, "A Consistent Scan Design System for Large-Scale ASICs," In in Proc. Fifth Asian Test Symposium, pages 82-87, November 1996.

[2] K. Itoh, Y. Shigehiro, I. Shirakawa, and K. Matsumura, "An Approach for Multi-Layer Gridless Routing," In in Proc. Printed Circuit World Convention VII, pp.P2-1-P2-7, May 1996.