国際会議

[1] D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-To-Array Mapping and Its Radiation Testing," In Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pages 313-316, November 2013.