| 著者名 (author) | 表題 (title) | 論文誌/会議名 | 巻数 (volume) | 号数 (number) | ページ範囲 (pages) | 刊行月 (month) | 出版年 (year) | IF / Acc. rate | File | |
| 国際会議 |
D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, T. Onoye |
MTTF Measurement Under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability |
IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE) | March |
2011 |
|
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