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分類	国際会議
著者名 (author)	H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye
英文著者名 (author)
キー (key)
表題 (title)	Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
表題 (英文)
定期刊行物名 (journal)	Proceedings of International Reliability Physics Symposium (IRPS)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)	213--217
刊行月 (month)	May
出版年 (year)	2010
Impact Factor (JCR)
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル

[1-91]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' Proceedings of International Reliability Physics Symposium (IRPS), pp. 213--217, May 2010.

@article{1_91,
    author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
    author_e = {},
    title = {Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-
    nm 10T Subthreshold SRAM},
    title_e = {},
    journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
    
    journal_e = {},
    volume = {},
    number = {},
    pages = {213--217},
    month = {May},
    year = {2010},
    impactfactor = {},
    note = {},
    annote = {}
}