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分類	国際会議
著者名 (author)	H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author)
キー (key)
表題 (title)	Comparative study on delay degrading estimation due to NBTI with circuit/instance/transistor-level stress probability consideration
表題 (英文)
定期刊行物名 (journal)	Proceedings of International Symposium on Quality Electronic Design (ISQED)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)	646--651
刊行月 (month)	March
出版年 (year)	2010
Impact Factor (JCR)
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル

[1-89]  H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Comparative Study on Delay Degrading Estimation Due to Nbti with Circuit/Instance/Transistor-Level Stress Probability Consideration,'' Proceedings of International Symposium on Quality Electronic Design (ISQED), pp. 646--651, March 2010.

@article{1_89,
    author = {H. Konoura and Y. Mitsuyama and M. Hashimoto and T. Onoye},
    author_e = {},
    title = {Comparative study on delay degrading estimation due to NBTI with
    circuit/instance/transistor-level stress probability consideration},
    title_e = {},
    journal = {Proceedings of International Symposium on Quality Electronic
    Design (ISQED)},
    journal_e = {},
    volume = {},
    number = {},
    pages = {646--651},
    month = {March},
    year = {2010},
    impactfactor = {},
    note = {},
    annote = {}
}