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分類	国際会議
著者名 (author)	Y. Ogasahara,T. Enami,M. Hashimoto,T. Sato,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key)
表題 (title)	Measurement results of delay degradation due to power supply noise well correlated with full-chip simulation
表題 (英文)
書籍・会議録表題 (booktitle)	Proceedings of IEEE Custom Integrated Circuits Conference (CICC),
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)	861-864
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month)	September
出版年 (year)	2006
採択率 (acceptance)
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル

[1-4]  Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, and T. Onoye, ``Measurement Results of Delay Degradation Due to Power Supply Noise Well Correlated with Full-Chip Simulation,'' In Proceedings of IEEE Custom Integrated Circuits Conference (CICC),, pp. 861-864, September 2006.

@inproceedings{1_4,
    author = {Y. Ogasahara and T. Enami and M. Hashimoto and T. Sato and T.
    Onoye},
    author_e = {},
    editor = {},
    editor_e = {},
    title = {Measurement results of delay degradation due to power supply noise
    well correlated with full-chip simulation},
    title_e = {},
    booktitle = {Proceedings of IEEE Custom Integrated Circuits Conference (CICC),},
    
    booktitle_e = {},
    volume = {},
    number = {},
    pages = {861-864},
    organization = {},
    publisher = {},
    publisher_e = {},
    address = {},
    month = {September},
    year = {2006},
    acceptance = {},
    note = {},
    annote = {}
}