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分類	論文誌
著者名 (author)	H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author)
キー (key)
表題 (title)	Stress Probability Computation for Estimating NBTI-Induced Delay Degradation
表題 (英文)
定期刊行物名 (journal)	IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
定期刊行物名 (英文)
巻数 (volume)	E94-A
号数 (number)	12
ページ範囲 (pages)	2545--2553
刊行月 (month)	December
出版年 (year)	2011
Impact Factor (JCR)
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル

[0-60]  H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Stress Probability Computation for Estimating Nbti-Induced Delay Degradation,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E94-A, no. 12, pp. 2545--2553, December 2011.

@article{0_60,
    author = {H. Konoura and Y. Mitsuyama and M. Hashimoto and T. Onoye},
    author_e = {},
    title = {Stress Probability Computation for Estimating NBTI-Induced Delay
    Degradation},
    title_e = {},
    journal = {IEICE Trans. on Fundamentals of Electronics, Communications and
    Computer Sciences},
    journal_e = {},
    volume = {E94-A},
    number = {12},
    pages = {2545--2553},
    month = {December},
    year = {2011},
    impactfactor = {},
    note = {},
    annote = {}
}