著者名 (author) 表題 (title) 論文誌/会議名 巻数 (volume) 号数 (number) ページ範囲 (pages) 刊行月 (month) 出版年 (year) File
論文誌
S. Hirokawa, R. Harada, M. Hashimoto, T. Onoye
Characterizing alpha- and neutron-induced SEU and MCU on SOTB and bulk 0.4-V SRAMs
IEEE Transactions on Nuclear Science



April
2015

論文誌
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-die Process Variation Effects
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
E97-A
7
1461--1467
July
2014

論文誌
H. Fuketa, R. Harada, M. Hashimoto, T. Onoye
Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM
IEEE Transactions on Device and Materials Reliability
14
1
463 -- 470
March
2014

論文誌
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
Impact of {NBTI}-Induced Pulse-Width Modulation on {SET} Pulse-Width Measurement
IEEE Transactions on Nuclear Science
60
4
2630--2634
August
2013

論文誌
R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, Y. Watanabe
Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
IEEE Transactions on Nuclear Science
59
6
2791--2795
December
2012

論文誌
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
Measurement Circuits for Acquiring {SET} Pulse Width Distribution with Sub-{FO1}-inverter-delay Resolution
IEICE Transaction on Fundamentals of Electronics, Communications and Computer Sciences
E93-A
12
2417-2423
December
2010
国際会議
S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, Y. Watanabe
Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation
IEEE Nuclear and Space Radiation Effects Conference (NSREC)



July
2015

国際会議
R. Harada, S. Hirokawa, M. Hashimoto
Measurement of Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4 V SRAMs
IEEE Nuclear and Space Radiation Effects Conference (NSREC)



July
2014

国際会議
R. Harada, M. Hashimoto, T. Onoye
NBTI Characterization Using Pulse-Width Modulation
IEEE/ACM Workshop on Variability Modeling and Characterization



November
2013

国際会議
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
Impact of NBTI-­Induced Pulse-Width Modulation on SET Pulse-Width Measurement
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)



September
2012

国際会議
R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, Y. Watanabe
Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
IEEE Nuclear and Space Radiation Effects Conference



July
2012

国際会議
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-die Process Variation Effects
Proceedings of International Reliability Physics Symposium (IRPS)



April
2012

国際会議
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
Neutron Induced Single Event Multiple Transients With Voltage Scaling and Body Biasing
Proc. International Reliability Physics Symposium (IRPS)



April
2011

国際会議
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
Measurement Circuits for Acquiring {SET} Pulse Width Distribution with Sub-{FO1}-inverter-delay Resolution
Proc. International Symposium on Quality Electronic Design (ISQED)



March
2010

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