著者名 (author) 表題 (title) 論文誌/会議名 巻数 (volume) 号数 (number) ページ範囲 (pages) 刊行月 (month) 出版年 (year) File
論文誌
T. Uemura, T. Kato, R. Tanabe, H. Iwata, J. Ariyoshi, H. Matsuyama, M. Hashimoto
Exploring Well-Configurations for Minimizing Single Event Latchup
IEEE Transactions on Nuclear Science
61
6
3282--3289
December
2014

論文誌
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
Mitigating Multi-Bit-Upset with Well-Slits in 28 nm Multi-Bit-Latch
IEEE Transactions on Nuclear Science
60
6
4362--4367
December
2013

論文誌
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
Soft-Error in SRAM at Ultra-Low Voltage and Impact of Secondary Proton in Terrestrial Environment
IEEE Transactions on Nuclear Science
60
6
4232--4237
December
2013

国際会議
T. Uemura, T. Kato, S. Okano, H. Matsuyama, M. Hashimoto
Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM
Proceedings of International Symposium on Reliability Physics (IRPS)



April
2015

国際会議
T. Uemura, S. Okano, T. Kato, H. Matsuyama, M. Hashimoto
Soft Error Immune Latch Design for 20 nm bulk CMOS
Proceedings of International Reliability Physics Symposium (IRPS)



April
2015

国際会議
T. Uemura, T. Kato, R. Tanabe, H. Iwata, J. Ariyoshi, H. Matsuyama, M. Hashimoto
Optimizing Well-Configuration for Minimizing Single Event Latchup
IEEE Nuclear and Space Radiation Effects Conference (NSREC)



July
2014

国際会議
T. Uemura, T. Kato, R. Tanabe, H. Iwata, H. Matsuyama, M. Hashimoto, K. Takahisa, M. Fukuda, K. Hatanaka
Preventing Single Event Latchup with Deep P-well on P-substrate
Proceedings of International Reliability Physics Symposium (IRPS)



June
2014

国際会議
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor reliability on Bulk CMOS Technology
IEEE Nuclear and Space Radiation Effects Conference (NSREC)



July
2013

国際会議
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
Soft-Error in SRAM at Ultra Low Voltage and Impact of Secondary Proton in Terrestrial Environment
IEEE Nuclear and Space Radiation Effects Conference (NSREC)



July
2013

国際会議
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
Mitigating Multi-Cell-Upset with Well-Slits in 28nm Multi-Bit-Latch
IEEE Nuclear and Space Radiation Effects Conference (NSREC)



July
2013


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