著者名 (author) 表題 (title) 論文誌/会議名 巻数 (volume) 号数 (number) ページ範囲 (pages) 刊行月 (month) 出版年 (year) File
論文誌
T. Kanamoto, T. Okumura, K. Furukawa, H. Takafuji, A. Kurokawa, K. Hachiya, T. Sakata, M. Tanaka, H. Nakashima, H. Masuda, T. Sato, M. Hashimoto
Impact of Self-heating in Wire Interconnection on Timing
IEICE Trans. on Electronics
E93-C
3
388--392
March
2010

論文誌
T. Sakata, T. Okumura, A. Kurokawa, H. Nakashima, H. Masuda, T. Sato, M. Hashimoto, K. Hachiya, K. Furukawa, M. Tanaka, H. Takafuji, T. Kanamoto
An Approach for Reducing Leakage Current Variation due to Manufacturing Variability
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
E92-A
12
3016--3023
December
2009

論文誌
T. Okumura, A. Kurokawa, H. Masuda, T. Kanamoto, M. Hashimoto, H. Takafuji, H. Nakashima, N. Ono, T. Sakata, T. Sato
Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
92-A
4
990--997
April
2009

論文誌
A. Kurokawa, M. Hashimoto, A. Kasebe, Z.-C. Huang, , Y. Yang, Y. Inoue, R. Inagaki, H. Masuda
Second-order Polynomial Expressions for On-chip Interconnect Capacitance
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
E88-A
12
3453-3462
December
2005

国際会議
Y. Masuda, M. Hashimoto, T. Onoye
Measurement of Timing Error Detection Performance of Software-based Error Detection Mechanisms and Its Correlation with Simulation
ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)


28-35
March
2016

国際会議
Y. Masuda, M. Hashimoto, T. Onoye
Performance Evaluation of Software-based Error Detection Mechanisms for Localizing Electrical Timing Failures under Dynamic Supply Noise
Proceedings of International Conference on Computer-Aided Design (ICCAD)


315-322
November
2015

国際会議
S. Iizuka, Y. Masuda, M. Hashimoto, T. Onoye
Stochastic Timing Error Rate Estimation under Process and Temporal Variations
Proceedings of International Test Conference (ITC)



October
2015


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