著者名 (author) 表題 (title) 論文誌/会議名 巻数 (volume) 号数 (number) ページ範囲 (pages) 刊行月 (month) 出版年 (year) File
論文誌
H. Konoura, D. Alnajjar, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, M. Hashimoto, T. Onoye, H. Onodera
Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-based Design and Its Irradiation Testing
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
E97-A
12
2518--2529
December
2014

論文誌
H. Konoura, T. Imagawa, Y. Mitsuyama, M. Hashimoto, T. Onoye
Comparative evaluation of lifetime enhancement with fault avoidance on dynamically reconfigurable devices
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
E97-A
7
1468--1482
July
2014

論文誌
H. Konoura, T. Kameda, Y. Mitsuyama, M. Hashimoto, T. Onoye
NBTI mitigation method by inputting random scan-in vectors in standby time
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
E97-A
7
1483--1491
July
2014

論文誌
D. Alnajjar, H. Konoura, Y. Ko, Y. Mitsuyama, M. Hashimoto, T. Onoye
Implementing Flexible Reliability in a Coarse Grained Reconfigurable Architecture
IEEE Transactions on VLSI Systems
21
12
2165 -- 2178
December
2013

論文誌
T.Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, T. Onoye
Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices
IEICE Trans. on Information and Systems
E96-D
8
1624--1631
August
2013

論文誌
H. Konoura, Y. Mitsuyama, M. Hashimoto, T. Onoye
Stress Probability Computation for Estimating {NBTI}-Induced Delay Degradation
IEICE Trans. Fundamentals
E94-A
12
2545-2553
December
2011

国際会議
M. Hashimoto, D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, T. Onoye, H. Onodera
Reliability-Configurable Mixed-Grained Reconfigurable Array Compatible with High-Level Synthesis
Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)


14--15
January
2015

国際会議
Hiroaki Konoura, Dawood Alnajjar, Yukio Mitsuyama, Hiroyuki Ochi, Takashi Imagawa, Shinichi Noda, Kazutoshi Wakabayashi, Masanori Hashimoto, Takao Onoye
Mixed-grained reconfigurable architecture supporting flexible reliability and C-based design
ReConFig



December
2013

国際会議
D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, T. Onoye, H. Onodera
Reliability-configurable mixed-grained reconfigurable array supporting C-to-array mapping and its radiation testing
Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC)


313-316
November
2013

国際会議
T. Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, T. Onoye
A Predictive Delay Fault Avoidance Scheme for Coarse-Grained Reconfigurable Architecture
Proceedings of International Conference on Field Programmable Logic and Applications (FPL)



August
2012

国際会議
H. Konoura, Y. Mitsuyama, M. Hashimoto, T. Onoye
Implications of reliability enhancement achieved by fault avoidance on dynamically reconfigurable architectures
Proc. 21st International Conference on Field Programmable Logic and Applications (FPL2011), Chania, Crete, Greece


189-194
September
2011

国際会議
Toshihiro Kameda, Hiroaki Konoura, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye
NBTI Mitigation by Giving Random Scan-in Vectors during Standby Mode
PATMOS2011



September
2011

国際会議
H. Konoura, Y. Mitsuyama, M. Hashimoto, T. Onoye
Comparative study on delay degrading estimation due to NBTI with circuit/instance/transistor-level stress probability consideration
Proc. International Symposium on Quality Electronic Design (ISQED)


646-651
March
2010

国際会議
D. Alnajjar, Y. Ko, T. Imagawa, H. Konoura, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, T. Onoye
Coarse-grained Dynamically Reconfigurable Architecture with Flexible Reliability
Proceedings of International Conference on Field Programmable Logic and Applications (FPL)


186--192
August
2009

研究会等発表論文
郡浦 宏明, 今川 隆司, 密山 幸男, 橋本 昌宜, 尾上 孝雄
動作合成に対応した信頼性可変混合粒度再構成可能アーキテクチャの検討
信学技報, RECONF2013-8
113
52
41-46
May
2013

研究会等発表論文
郡浦 宏明, 今川 隆司, 密山 幸男, 橋本 昌宜, 尾上 孝雄
動的部分再構成による故障回避に関する一考察
信学技報, RECONF2012-59
112
325
71-76
November
2012

研究会等発表論文
亀田 敏広, 郡浦 宏明, 密山 幸男, 橋本 昌宜, 尾上 孝雄
スキャンパスを用いたNBTI劣化抑制に関する研究
情報処理学会DAシンポジウム


201-206
August
2011

研究会等発表論文
郡浦 宏明, 密山 幸男, 橋本 昌宜, 尾上 孝雄
動的再構成可能アーキテクチャによる故障回避機構の定量的評価
信学技報, RECONF2011-6
111
31
31-36
May
2011

研究会等発表論文
郡浦 宏明, 密山 幸男, 橋本 昌宜, 尾上 孝雄
NBTI による劣化予測におけるトランジスタ動作確率算出法の評価
情報処理学会DAシンポジウム


181-186
August
2009


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