著者名 (author) 表題 (title) 論文誌/会議名 巻数 (volume) 号数 (number) ページ範囲 (pages) 刊行月 (month) 出版年 (year) File
論文誌
H. Konoura, D. Alnajjar, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, M. Hashimoto, T. Onoye, H. Onodera
Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-based Design and Its Irradiation Testing
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
E97-A
12
2518--2529
December
2014

論文誌
D. Alnajjar, H. Konoura, Y. Ko, Y. Mitsuyama, M. Hashimoto, T. Onoye
Implementing Flexible Reliability in a Coarse Grained Reconfigurable Architecture
IEEE Transactions on VLSI Systems
21
12
2165 -- 2178
December
2013

論文誌
T.Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, T. Onoye
Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices
IEICE Trans. on Information and Systems
E96-D
8
1624--1631
August
2013

論文誌
D. Alnajjar, Y. Mitsuyama, M. Hashimoto, T. Onoye
PVT-induced Timing Error Detection through Replica Circuits and Time Redundancy in Reconfigurable Devices
IEICE Electronics Express (ELEX)
10
5

April
2013

国際会議
M. Hashimoto, D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, T. Onoye, H. Onodera
Reliability-Configurable Mixed-Grained Reconfigurable Array Compatible with High-Level Synthesis
Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)


14--15
January
2015

国際会議
Hiroaki Konoura, Dawood Alnajjar, Yukio Mitsuyama, Hiroyuki Ochi, Takashi Imagawa, Shinichi Noda, Kazutoshi Wakabayashi, Masanori Hashimoto, Takao Onoye
Mixed-grained reconfigurable architecture supporting flexible reliability and C-based design
ReConFig



December
2013

国際会議
D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, T. Onoye, H. Onodera
Reliability-configurable mixed-grained reconfigurable array supporting C-to-array mapping and its radiation testing
Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC)


313-316
November
2013

国際会議
D. Alnajjar, Y. Mitsuyama, M. Hashimoto, T. Onoye
Static Voltage Over-scaling and Dynamic Voltage Variation Tolerance with Replica Circuits and Time Redundancy in Reconfigurable Devices
Proceedings of International Conference on ReConFigurable Computing and FPGAs (ReConFig)



December
2012

国際会議
T. Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, T. Onoye
A Predictive Delay Fault Avoidance Scheme for Coarse-Grained Reconfigurable Architecture
Proceedings of International Conference on Field Programmable Logic and Applications (FPL)



August
2012

国際会議
D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, T. Onoye
MTTF Measurement Under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability
IEEE Workshop on Silicon Errors in Logic - System Effects



March
2011

国際会議
D. Alnajjar, Y. Ko, T. Imagawa, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, T. Onoye
Soft Error Resilient VLSI Architecture for Signal Processing
Proceedings of IEEE International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS)


183--186
December
2009

国際会議
D. Alnajjar, Y. Ko, T. Imagawa, H. Konoura, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, T. Onoye
Coarse-grained Dynamically Reconfigurable Architecture with Flexible Reliability
Proceedings of International Conference on Field Programmable Logic and Applications (FPL)


186--192
August
2009

国際会議
Y. Ko, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, T. Onoye
Coarse-Grained Dynamically Reconfigurable Architecture with Flexible Reliability
Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI)


236--241
March
2009

国際会議
D. Alnajjar, Y. Ko, T. Imagawa, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, T. Onoye
A Coarse-Grained Dynamically Reconfigurable Architecture Enabling Flexible Reliability
Proceedings of IEEE Workshop on System Effects of Logic Soft Errors (SELSE)



March
2009

研究会等発表論文
尾上孝雄, 橋本昌宜, 密山幸男, Dawood Alnajjar, 郡浦宏明
VLSIの信頼性を向上させる再構成可能アーキテクチャ (Invited)
信学技報リコンフィギャラブルシステム研究会



November
2013

研究会等発表論文
郡浦 宏明, Dawood Alnajjar, 密山 幸男, 越智 裕之, 今川 隆司, 野田 真一, 若林 一敏, 橋本 昌宜, 尾上 孝雄
C ベース設計に対応した信頼性可変粒度複合型再構成可能アーキテクチャ
LSIとシステムのワークショップ



May
2013


This site is maintained by Onoye Lab.

PMAN 2.5.5 - Paper MANagement system / (C) 2002-2008, Osamu Mizuno / All rights reserved.