論文誌
[1]  T. Uemura, T. Kato, R. Tanabe, H. Iwata, J. Ariyoshi, H. Matsuyama, and M. Hashimoto, ``Exploring Well-Configurations for Minimizing Single Event Latchup,'' IEEE Transactions on Nuclear Science, vol. 61, no. 6, pp. 3282--3289, December 2014.
[2]  T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Mitigating Multi-Bit-Upset with Well-Slits in 28 Nm Multi-Bit-Latch,'' IEEE Transactions on Nuclear Science, vol. 60, no. 6, pp. 4362--4367, December 2013.
[3]  T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Soft-Error in Sram at Ultra-Low Voltage and Impact of Secondary Proton in Terrestrial Environment,'' IEEE Transactions on Nuclear Science, vol. 60, no. 6, pp. 4232--4237, December 2013.
[4]  R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, ``Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' IEEE Transactions on Nuclear Science, vol. 59, no. 6, pp. 2791--2795, December 2012.
国際会議
[1]  T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, ``Impact of Package on Neutron Induced Single Event Upset in 20 Nm Sram,'' Proceedings of International Symposium on Reliability Physics (IRPS), April 2015.
[2]  T. Uemura and M. Hashimoto, ``Investigation of Single Event Upset and Total Ionizing Dose in Feram for Medical Electronic Tag,'' Proceedings of International Symposium on Reliability Physics (IRPS), April 2015.
[3]  T. Uemura, S. Okano, T. Kato, H. Matsuyama, and M. Hashimoto, ``Soft Error Immune Latch Design for 20 Nm Bulk Cmos,'' Proceedings of International Reliability Physics Symposium (IRPS), April 2015.
[4]  T. Uemura, T. Kato, R. Tanabe, H. Iwata, J. Ariyoshi, H. Matsuyama, and M. Hashimoto, ``Optimizing Well-Configuration for Minimizing Single Event Latchup,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.
[5]  T. Uemura, T. Kato, R. Tanabe, H. Iwata, H. Matsuyama, M. Hashimoto, K. Takahisa, M. Fukuda, and K. Hatanaka, ``Preventing Single Event Latchup with Deep P-Well on P-Substrate,'' Proceedings of International Reliability Physics Symposium (IRPS), June 2014.
[6]  T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Scaling Trend of Sram and Ff of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk Cmos Technology,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.
[7]  T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Soft-Error in Sram at Ultra Low Voltage and Impact of Secondary Proton in Terrestrial Environment,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.
[8]  T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Mitigating Multi-Cell-Upset with Well-Slits in 28nm Multi-Bit-Latch,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.
[9]  R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, ``Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' IEEE Nuclear and Space Radiation Effects Conference, July 2012.

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