国際会議
[1]  D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Mttf Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability,'' In IEEE Workshop on Silicon Errors in Logic - System Effects, March 2011.
[2]  T. Kouno, M. Hashimoto, and H. Onodera, ``Input Capacitance Modeling of Logic Gates for Accurate Static Timing Analysis,'' In Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pp. 453-456, November 2005.

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