T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, ``Impact of Package on Neutron Induced Single Event Upset in 20 Nm Sram,'' Proceedings of International Symposium on Reliability Physics (IRPS), April 2015.
T. Uemura, S. Okano, T. Kato, H. Matsuyama, and M. Hashimoto, ``Soft Error Immune Latch Design for 20 Nm Bulk Cmos,'' Proceedings of International Reliability Physics Symposium (IRPS), April 2015.
A. Kotani, Y. Asai, Y. Nakamura, S. Okada, N. Koyama, K. Yamane, Y.Okano, Y. Mitsuyama, and T. Onoye, ``Visibility Font Technology on High Resolution Color LCD "LCFONT.c",'' In in Proc. The 2003 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2003), Kang-Woo Do, Korea, vol. 1, pp. 535--538, July 2003.