論文誌
[1]  S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, ``Characterizing Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4-V Srams,'' IEEE Transactions on Nuclear Science, April 2015.
[2]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Set Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E97-A, no. 7, pp. 1461--1467, July 2014.
[3]  H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, ``Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10t Subthreshold Sram,'' IEEE Transactions on Device and Materials Reliability, vol. 14, no. 1, p. 463 -- 470, March 2014.
[4]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Impact of NBTI-Induced Pulse-Width Modulation on SET Pulse-Width Measurement,'' IEEE Transactions on Nuclear Science, vol. 60, no. 4, pp. 2630--2634, August 2013.
[5]  R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, ``Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' IEEE Transactions on Nuclear Science, vol. 59, no. 6, pp. 2791--2795, December 2012.
[6]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-Inverter-Delay Resolution,'' IEICE Transaction on Fundamentals of Electronics, Communications and Computer Sciences, vol. E93-A, no. 12, pp. 2417-2423, December 2010.
国際会議
[1]  S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, ``Neutron-Induced Seu and Mcu Rate Characterization and Analysis of Sotb and Bulk Srams at 0.3v Operation,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.
[2]  R. Harada, S. Hirokawa, and M. Hashimoto, ``Measurement of Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4 V Srams,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.
[3]  R. Harada, M. Hashimoto, and T. Onoye, ``Nbti Characterization Using Pulse-Width Modulation,'' IEEE/ACM Workshop on Variability Modeling and Characterization, November 2013.
[4]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Impact of Nbti-­Induced Pulse-Width Modulation on Set Pulse-Width Measurement,'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2012.
[5]  R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, ``Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' IEEE Nuclear and Space Radiation Effects Conference, July 2012.
[6]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Set Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects,'' Proceedings of International Reliability Physics Symposium (IRPS), April 2012.
[7]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Neutron Induced Single Event Multiple Transients with Voltage Scaling and Body Biasing,'' In Proc. International Reliability Physics Symposium (IRPS), April 2011.
[8]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-Inverter-Delay Resolution,'' In Proc. International Symposium on Quality Electronic Design (ISQED), March 2010.

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