論文誌
[1]  Z. Huang, A. Kurokawa, M. Hashimoto, T. Sato, M. Jiang, and Y. Inoue, ``Modeling the Overshooting Effect for Cmos Inverter Delay Analysis in Nanometer Technologies,'' IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems , vol. 29, no. 2, pp. 250--260, February 2010.
国際会議
[1]  U. Schlichtmann, M. Hashimoto, I. H.-R. Jiang, and B. Li, ``Reliability, Adaptability and Flexibility in Timing: Buy a Life Insurance for Your Circuits (Invited),'' Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 705--711, January 2016.

This site is maintained by Onoye Lab.

PMAN 2.5.5 - Paper MANagement system / (C) 2002-2008, Osamu Mizuno / All rights reserved.