論文誌
[1]  S. Iizuka, Y. Higuchi, M. Hashimoto, and T. Onoye, ``Device-Parameter Estimation with Sensitivity-Configurable Ring Oscillator,'' IEICE Trans. Fundamentals of Electronics Communications and Computer Sciences, vol. E98-A, no. 12, pp. 2607--2613, December 2015.
[2]  D. Fukuda, K. Watanabe, Y. Kanazawa, and M. Hashimoto, ``Modeling the Effect of Global Layout Pattern on Wire Width Variation for On-The-Fly Etching Process Modification,'' IEICE Trans. Fundamentals of Electronics Communications and Computer Sciences, vol. E98-A, no. 7, pp. 1467--1474, July 2015.
[3]  T. Shinada, M. Hashimoto, and T. Onoye, ``Proximity Distance Estimation Based on Electric Field Communication between 1mm³ Sensor Nodes,'' Analog Integrated Circuits and Signal Processing, May 2015.
[4]  S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, ``Characterizing Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4-V Srams,'' IEEE Transactions on Nuclear Science, April 2015.
[5]  H. Konoura, D. Alnajjar, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, ``Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-Based Design and Its Irradiation Testing,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E97-A, no. 12, pp. 2518--2529, December 2014.
[6]  T. Amaki, M. Hashimoto, and T. Onoye, ``A Process and Temperature Tolerant Oscillator-Based True Random Number Generator,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E97-A, no. 12, pp. 2393--2399, December 2014.
[7]  D. Fukuda, K. Watanabe, N. Idani, Y. Kanazawa, and M. Hashimoto, ``Edge-Over-Erosion Error Prediction Method Based on Multi-Level Machine Learning Algorithm,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E97-A, no. 12, pp. 2373--2382, December 2014.
[8]  T. Uemura, T. Kato, R. Tanabe, H. Iwata, J. Ariyoshi, H. Matsuyama, and M. Hashimoto, ``Exploring Well-Configurations for Minimizing Single Event Latchup,'' IEEE Transactions on Nuclear Science, vol. 61, no. 6, pp. 3282--3289, December 2014.
[9]  H. Konoura, T. Imagawa, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Comparative Evaluation of Lifetime Enhancement with Fault Avoidance on Dynamically Reconfigurable Devices,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E97-A, no. 7, pp. 1468--1482, July 2014.
[10]  H. Konoura, T. Kameda, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Nbti Mitigation Method by Inputting Random Scan-In Vectors in Standby Time,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E97-A, no. 7, pp. 1483--1491, July 2014.
[11]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Set Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E97-A, no. 7, pp. 1461--1467, July 2014.
[12]  H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, ``Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10t Subthreshold Sram,'' IEEE Transactions on Device and Materials Reliability, vol. 14, no. 1, p. 463 -- 470, March 2014.
[13]  D. Alnajjar, H. Konoura, Y. Ko, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Implementing Flexible Reliability in a Coarse Grained Reconfigurable Architecture,'' IEEE Transactions on VLSI Systems, vol. 21, no. 12, p. 2165 -- 2178, December 2013.
[14]  T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Mitigating Multi-Bit-Upset with Well-Slits in 28 Nm Multi-Bit-Latch,'' IEEE Transactions on Nuclear Science, vol. 60, no. 6, pp. 4362--4367, December 2013.
[15]  T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Soft-Error in Sram at Ultra-Low Voltage and Impact of Secondary Proton in Terrestrial Environment,'' IEEE Transactions on Nuclear Science, vol. 60, no. 6, pp. 4232--4237, December 2013.
[16]  K. Shinkai, M. Hashimoto, and T. Onoye, ``A Gate-Delay Model Focusing on Current Fluctuation Over Wide Range of Process-Voltage-Temperature Variations,'' Integration, the VLSI Journal, vol. 46, no. 4, pp. 345--358, September 2013.
[17]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Impact of NBTI-Induced Pulse-Width Modulation on SET Pulse-Width Measurement,'' IEEE Transactions on Nuclear Science, vol. 60, no. 4, pp. 2630--2634, August 2013.
[18]  T.Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices,'' IEICE Trans. on Information and Systems , vol. E96-D, no. 8, pp. 1624--1631, August 2013.
[19]  T. Amaki, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``A Worst-Case-Aware Design Methodology for Noise-Tolerant Oscillator-Based True Random Number Generator with Stochastic Behavior Modeling,'' IEEE Transactions on Information Forensics and Security, vol. 8, no. 8, pp. 1331--1342, August 2013.
[20]  Y. Ogasahara, M. Hashimoto, T. Kanamoto, and T. Onoye, ``Supply Noise Suppression by Triple-Well Structure,'' IEEE Transactions on VLSI Systems, vol. 21, no. 4, pp. 781--785, April 2013.
[21]  D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Pvt-Induced Timing Error Detection Through Replica Circuits and Time Redundancy in Reconfigurable Devices,'' IEICE Electronics Express (ELEX), vol. 10, no. 5, April 2013.
[22]  I. Homjakovs, T. Hirose, Y. Osaki, M. Hashimoto, and T. Onoye, ``A 0.8-V 110-Na Cmos Current Reference Circuit Using Subthreshold Operation,'' IEICE Electronics Express (ELEX), vol. 10, no. 4, March 2013.
[23]  T. Amaki, M. Hashimoto, and T. Onoye, ``Jitter Amplifier for Oscillator-Based True Random Number Generator,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E96-A, no. 3, pp. 684--696, March 2013.
[24]  I. Homjakovs, M. Hashimoto, T. Hirose, and T. Onoye, ``Signal-Dependent Analog-To-Digital Conversion Based on Minimax Sampling,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E96-A, no. 2, pp. 459--468, February 2013.
[25]  T. Enami, T. Sato, and M. Hashimoto, ``Power Distribution Network Optimization for Timing Improvement with Statistical Noise Model and Timing Analysis,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E95-A, no. 12, pp. 2261--2271, December 2012.
[26]  Y. Takai, M. Hashimoto, and T. Onoye, ``Power Gating Implementation for Supply Noise Mitigation with Body-Tied Triple-Well Structure,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E95-A, no. 12, pp. 2220--2225, December 2012.
[27]  S. Kimura, M. Hashimoto, and T. Onoye, ``A Body Bias Clustering Method for Low Test-Cost Post-Silicon Tuning,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E95-A, no. 12, pp. 2292--2300, December 2012.
[28]  R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, ``Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' IEEE Transactions on Nuclear Science, vol. 59, no. 6, pp. 2791--2795, December 2012.
[29]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Adaptive Performance Compensation with In-Situ Timing Error Predictive Sensors for Subthreshold Circuits,'' IEEE Transactions on VLSI Systems, vol. 20, no. 2, pp. 333--343, February 2012.
[30]  H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Stress Probability Computation for Estimating NBTI-Induced Delay Degradation,'' IEICE Trans. Fundamentals, vol. E94-A, no. 12, pp. 2545-2553, December 2011.
[31]  K. Shinkai, M. Hashimoto, and T. Onoye, ``Extracting Device-Parameter Variations with Ro-Based Sensors,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E94-A, no. 12, pp. 2537--2544, December 2011.
[32]  T. Okumura and M. Hashimoto, ``Setup Time, Hold Time and Clock-To-Q Delay Computation under Dynamic Supply Noise,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E94-A, no. 10, pp. 1948--1953, October 2011.
[33]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' IEEE Transactions on Nuclear Science, vol. 58, no. 4, pp. 2097--2102, August 2011.
[34]  H. Fuketa, D. Kuroda, M. Hashimoto, and T. Onoye, ``An Average-Performance-Oriented Subthreshold Processor Self-Timed by Memory Read Completion,'' IEEE Transactions on Circuits and Systems II, vol. 58, no. 5, pp. 299--303, May 2011.
[35]  T. Enami, S. Ninomiya, K. Shinkai, S. Abe, and M. Hashimoto, ``Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation,'' IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, vol. 93-A, no. 12, pp. 2399-2408, December 2010.
[36]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-Inverter-Delay Resolution,'' IEICE Transaction on Fundamentals of Electronics, Communications and Computer Sciences, vol. E93-A, no. 12, pp. 2417-2423, December 2010.
[37]  S. Ninomiya and M. Hashimoto, ``Accuracy Enhancement of Grid-Based Ssta by Coefficient Interpolation,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E93-A, no. 12, pp. 2441--2446, December 2010.
[38]  T. Okumura, F. Minami, K. Shimazaki, K. Kuwada, and M. Hashimoto, ``Gate Delay Estimation in Sta under Dynamic Power Supply Noise,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E93-A, no. 12, pp. 2447--2455, December 2010.
[39]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Transistor Variability Modeling and Its Validation with Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits,'' IEEE Transactions on VLSI Systems, vol. 18, no. 7, pp. 1118--1129, July 2010.
[40]  密山 幸男, 高橋 一真, 今井 林太郎, 橋本 昌宜, 尾上 孝雄, 白川 功, ``メディア処理向け再構成可能アーキテクチャでの動画像復号処理の実現,'' 電子情報通信学会論文誌, vol. J93-A, no. 6, pp. 397-413, June 2010.
[41]  K. Shinkai, M. Hashimoto, and T. Onoye, ``Prediction of Self-Heating in Short Intra-Block Wires,'' IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, vol. E93-A, no. 3, pp. 583-594, March 2010.
[42]  T. Kanamoto, T. Okumura, K. Furukawa, H. Takafuji, A. Kurokawa, K. Hachiya, T. Sakata, M. Tanaka, H. Nakashima, H. Masuda, T. Sato, and M. Hashimoto, ``Impact of Self-Heating in Wire Interconnection on Timing,'' IEICE Trans. on Electronics, vol. E93-C, no. 3, pp. 388--392, March 2010.
[43]  Z. Huang, A. Kurokawa, M. Hashimoto, T. Sato, M. Jiang, and Y. Inoue, ``Modeling the Overshooting Effect for Cmos Inverter Delay Analysis in Nanometer Technologies,'' IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems , vol. 29, no. 2, pp. 250--260, February 2010.
[44]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Trade-Off Analysis between Timing Error Rate and Power Dissipation for Adaptive Speed Control with Timing Error Prediction,'' IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, vol. E92-A, no. 12, pp. 3094-3102, December 2009.
[45]  T. Sakata, T. Okumura, A. Kurokawa, H. Nakashima, H. Masuda, T. Sato, M. Hashimoto, K. Hachiya, K. Furukawa, M. Tanaka, H. Takafuji, and T. Kanamoto, ``An Approach for Reducing Leakage Current Variation Due to Manufacturing Variability,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E92-A, no. 12, pp. 3016--3023, December 2009.
[46]  A. Kurokawa, T. Sato, T. Kanamoto, and M. Hashimoto, ``Interconnect Modeling: a Physical Design Perspective (Invited),'' IEEE Transactions on Electron Devices, vol. 56, no. 9, pp. 1840--1851, September 2009.
[47]  Y. Ogasahara, M. Hashimoto, and T. Onoye, ``All Digital Ring-Oscillator Based Macro for Sensing Dynamic Supply Noise Waveform,'' IEEE Journal of Solid-State Circuits, vol. 44, no. 6, pp. 1745--1755, June 2009.
[48]  T. Enami, S. Ninomiya, and M. Hashimoto, ``Statistical Timing Analysis Considering Spatially and Temporally Correlated Dynamic Power Supply Noise,'' IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol. 28, no. 4, pp. 541-553, April 2009.
[49]  T. Okumura, A. Kurokawa, H. Masuda, T. Kanamoto, M. Hashimoto, H. Takafuji, H. Nakashima, N. Ono, T. Sakata, and T. Sato, ``Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. 92-A, no. 4, pp. 990--997, April 2009.
[50]  K. Hamamoto, H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``An Experimental Study on Body-Biasing Layout Style Focusing on Area Efficiency and Speed Controllability,'' IEICE Trans. on Electronics, vol. E92-C, no. 2, pp. 281-285, February 2009.
[51]  Y. Mitsuyama, K. Takahashi, R. Imai, M. Hashimoto, T. Onoye, I. Shirakawa, ``Area-Efficient Reconfigurable Architecture for Media Processin,'' IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, vol. E91-A, no. 12, pp. 3651-3662, December 2008.
[52]  T. Kanamoto, Y. Ogasahara, K. Natsume, K. Yamaguchi, H. Amishiro, T. Watanabe, and M. Hashimoto, ``Impact of Well Edge Proximity Effect on Timing,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E91-A, no. 12, pp. 3461-3464, December 2008.
[53]  S. Abe, M. Hashimoto, and T. Onoye, ``Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E91-A, no. 12, pp. 3481-3487, December 2008.
[54]  M. Hashimoto, J. Siriporn, A. Tsuchiya, H. Zhu, and C.-K. Cheng, ``Analytical Eye-Diagram Model for On-Chip Distortionless Transmission Lines and Its Application to Design Space Exploration,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E91-A, no. 12, pp. 3474-3480, December 2008.
[55]  R. Hashimoto, T. Matsumura, Y. Nozato, K. Watanabe, and T. Onoye, ``Implementation of Multi-Agent Object Attention System Based on Biologically Inspired Attractor Selection,'' IEICE Trans. Fundamentals, vol. E91-A, no. 10, October 2008.
[56]  Y. Ogasahara, M. Hashimoto, and T. Onoye, ``Measurement and Analysis of Inductive Coupling Noise in 90nm Global Interconnects,'' IEEE Journal of Solid-State Circuits, vol. 43, no. 3, pp. 718-728, March 2008.
[57]  M. Hashimoto, J. Yamaguchi, T. Sato, and H. Onodera, ``Timing Analysis Considering Temporal Supply Voltage Fluctuation,'' IEICE Trans. on Information and Systems , vol. E91-D, no. 3, pp. 655--660, March 2008.
[58]  M. Hashimoto, T. Ijichi, S. Takahashi, S. Tsukiyama, and I. Shirakawa, ``Transistor Sizing of LCD Driver Circuit for Technology Migration,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E90-A, no. 12, pp. 2712--2717, December 2007.
[59]  M. Hashimoto, J. Yamaguchi, and H. Onodera, ``Timing Analysis Considering Spatial Power/Ground Level Variation,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E90-A, no. 12, pp. 2661-2668, December 2007.
[60]  Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, and T. Onoye, ``Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop with On-Chip Delay Measurement,'' IEEE Trans. on Circuits and Systems—II: Express Briefs, vol. 54, no. 10, pp. 868-872, October 2007.
[61]  A. Tsuchiya, M. Hashimoto, and H. Onodera, ``Optimal Termination of On-Chip Transmission-Lines for High-Speed Signaling,'' IEICE Trans. on Electronics, vol. E90-C, no. 6, pp. 1267-1273, June 2007.
[62]  Y. Ogasahara, M. Hashimoto, and T. Onoye, ``Quantitative Prediction of On-Chip Capacitive and Inductive Crosstalk Noise and Tradeoff between Wire Cross Sectional Area and Inductive Crosstalk Effect,'' In IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E90-A, no. 4, pp. 724--731, April 2007.
[63]  S. Takahashi, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, ``A Sampling Switch Design Procedure for Active Matrix Liquid Crystal Displays,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E89-A, no. 12, pp. 3538--3545, December 2006.
[64]  T. Kanamoto, T. Ikeda, A. Tsuchiya, H. Onodera, and M. Hashimoto, ``Si-Substrate Modeling Toward Substrate-Aware Interconnect Resistance and Inductance Extraction in Soc Design,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E89-A, no. 12, pp. 3560--3568, December 2006.
[65]  S. Takahashi, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, ``A Sampling Switch Design Procedure for Active Matrix Liquid Crystal Displays,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E89-A, no. 12, pp. 3538-3545, December 2006.
[66]  T. Kanamoto, T. Ikeda, A. Tsuchiya, H. Onodera, and M. Hashimoto, ``Si-Substrate Modeling Toward Substrate-Aware Interconnect Resistance and Inductance Extraction in Soc Design,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E89-A, no. 12, pp. 3560-3568, December 2006.
[67]  T. Kanamoto, T. Ikeda, A. Tsuchiya, H. Onodera, and M. Hashimoto, ``Si-Substrate Modeling Toward Substrate-Aware Interconnect Resistance and Inductance Extraction in Soc Design,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E89-A, no. 12, pp. 3560-3568, December 2006.
[68]  T. Sato, J. Ichimiya, N. Ono, and M. Hashimoto, ``On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E89-A, no. 12, pp. 3491-3499, December 2006.
[69]  T. Kanamoto, S. Akutsu, T. Nakabayashi, T. Ichinomiya, K. Hachiya, A. Kurokawa, H. Ishikawa, S. Muromoto, H. Kobayashi, and M Hashimoto, ``Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E89-A, no. 12, pp. 3666-3670, December 2006.
[70]  内田好弘, 谷貞宏, 橋本昌宜, 築山修治, 白川功, ``グラウンド平面・シールド配線によるシステム・オン・パネルの配線間容量の低減と容量見積りの容易化,'' 情報処理学会論文誌, vol. 47, no. 6, pp. 1665--1673, June 2006.
[71]  M. Hashimoto, T. Yamamoto, and H. Onodera, ``Statistical Analysis of Clock Skew Variation in H-Tree Structure,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E88-A, no. 12, pp. 3375-3381, December 2005.
[72]  A. Muramatsu, M. Hashimoto, and H. Onodera, ``Effects of On-Chip Inductance on Power Distribution Grid,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E88-A, no. 12, pp. 3564-3572, December 2005.
[73]  T. Sato, M. Hashimoto, and H. Onodera, ``Successive Pad Assignment for Minimizing Supply Voltage Drop,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E88-A, no. 12, pp. 3429-3436, December 2005.
[74]  T. Sato, J. Ichimiya, N. Ono, K. Hachiya, and M. Hashimoto, ``On-Chip Thermal Gradient Analysis and Temperature Flattening for Soc Design,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E88-A, no. 12, pp. 3382-3389, December 2005.
[75]  A. Kurokawa, M. Hashimoto, A. Kasebe, Z.-C. Huang, , Y. Yang, Y. Inoue, R. Inagaki, and H. Masuda, ``Second-Order Polynomial Expressions for On-Chip Interconnect Capacitance,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E88-A, no. 12, pp. 3453-3462, December 2005.
[76]  内田 好弘, 谷 貞宏, 橋本 昌宜, 築山 修治, 白川 功, ``システム液晶のための配線容量抽出手法,'' 情報処理学会論文誌, vol. 46, no. 6, pp. 1395--1403, June 2005.
[77]  A. Tsuchiya, M. Hashimoto, and H. Onodera, ``Performance Limitation of On-Chip Global Interconnects for High-Speed Signaling,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Science, vol. E88-A, no. 4, pp. 885-891, April 2005.
[78]  T. Miyazaki, M. Hashimoto, and H. Onodera, ``A Performance Prediction of Clock Generation Plls: a Ring Oscillator Based Pll and an Lc Oscillator Based Pll,'' IEICE Trans. on Electronics, vol. E88-C, no. 3, pp. 437-444, March 2005.
[79]  M. Hashimoto and H. Onodera, ``Crosstalk Noise Optimization by Post-Layout Transistor Sizing,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E87-A, no. 12, pp. 3251-3257, December 2004.
[80]  M. Hashimoto, Y. Yamada, and H. Onodera, ``Equivalent Waveform Propagation for Static Timing Analysis,'' IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems , vol. 23, no. 4, pp. 498-508, April 2004.
国際会議
[1]  Ryo Shirai, Tetsuya Hirose, and Masanori Hashimoto, ``Dedicated Antenna Less Power Efficient Ook Transmitter for Mm-Cubic Iot Nodes,'' Proceedings of European Microwave Conference (EuMC), (to appear).
[2]  Ryo Shirai, Jin Kono, Tetsuya Hirose, and Masanori Hashimoto, ``Near-Field Dual-Use Antenna for Magnetic-Field Based Communication and Electrical-Field Based Distance Sensing in Mm^3-Class Sensor Node,'' Proceedings of IEEE International Symposium on Circuits and Systems (ISCAS), pp. 124--127, May 2017.
[3]  Y. Masuda, M. Hashimoto, and T. Onoye, ``Measurement of Timing Error Detection Performance of Software-Based Error Detection Mechanisms and Its Correlation with Simulation,'' In ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 28-35, March 2016.
[4]  R. Doi, J. Hotate, T. Kishimoto, T. Higashi, H. Ochi, M. Tada, T. Sugibayashi, K. Wakabayashi, H. Onodera, Y. Mitsuyama, and M. Hashimoto, ``Highly-Dense Mixed Grained Reconfigurable Architecture with Via-Switch,'' ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), March 2016.
[5]  U. Schlichtmann, M. Hashimoto, I. H.-R. Jiang, and B. Li, ``Reliability, Adaptability and Flexibility in Timing: Buy a Life Insurance for Your Circuits (Invited),'' Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 705--711, January 2016.
[6]  N. Banno, M.Tada, K. Okamoto, N. Iguchi, T. Sakamoto, M. Miyamura, Y. Tsuji, H. Hada, H. Ochi, H. Onodera, M. Hashimoto, and T. Sugibayashi Author(s) in English , ``A Novel Two-Varistors (A-Si/Sin/A-Si) Selected Complementary Atom Switch (2v-1cas) for Nonvolatile Crossbar Switch with Multiple Fan-Outs,'' Technical Digest of IEEE International Electron Devices Meeting (IEDM), pp. 32--35, December 2015.
[7]  Y. Masuda, M. Hashimoto, and T. Onoye, ``Performance Evaluation of Software-Based Error Detection Mechanisms for Localizing Electrical Timing Failures under Dynamic Supply Noise,'' In Proceedings of International Conference on Computer-Aided Design (ICCAD), pp. 315-322, November 2015.
[8]  R. Doi, M. Hashimoto, and T. Onoye, ``An Analytic Evaluation on Soft Error Immunity Enhancement Due to Temporal Triplication,'' IEEE Pacific Rim International Symposium on Dependable Computing (PRDC), November 2015.
[9]  S. Iizuka, Y. Masuda, M. Hashimoto, and T. Onoye, ``Stochastic Timing Error Rate Estimation under Process and Temporal Variations,'' In Proceedings of International Test Conference (ITC), October 2015.
[10]  Y. Akihara, T. Hirose, Y. Tanaka, N. Kuroki, M. Numa, and M. Hashimoto, ``A Wireless Power Transfer System for Small-Sized Sensor Applications,'' Proceedings of International Conference on Solid State Devices and Materials (SSDM), pp. 154--155, September 2015.
[11]  S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, ``Neutron-Induced Seu and Mcu Rate Characterization and Analysis of Sotb and Bulk Srams at 0.3v Operation,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.
[12]  M. Ueno, M. Hashimoto, and T. Onoye, ``Real-Time On-Chip Supply Voltage Sensor and Its Application to Trace-Based Timing Error Localization,'' Proceedings of International On-Line Testing Symposium (IOLTS), pp. 188--193, July 2015.
[13]  M. Hashimoto, ``Run-Time Performance Adaptation: Opportunities and Challenges (Invited),'' Proceedings of IEEE Conference on Electron Devices and Solid-State Circuits (EDSSC), June 2015.
[14]  T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, ``Impact of Package on Neutron Induced Single Event Upset in 20 Nm Sram,'' Proceedings of International Symposium on Reliability Physics (IRPS), April 2015.
[15]  T. Uemura and M. Hashimoto, ``Investigation of Single Event Upset and Total Ionizing Dose in Feram for Medical Electronic Tag,'' Proceedings of International Symposium on Reliability Physics (IRPS), April 2015.
[16]  T. Uemura, S. Okano, T. Kato, H. Matsuyama, and M. Hashimoto, ``Soft Error Immune Latch Design for 20 Nm Bulk Cmos,'' Proceedings of International Reliability Physics Symposium (IRPS), April 2015.
[17]  S. Ukawa, T. Shinada, M. Hashimoto, Y. Itoh, and T. Onoye, ``3d Node Localization from Node-To-Node Distance Information Using Cross-Entropy Method,'' Proceedings of Virtual Reality Conference (VR), March 2015.
[18]  S. Iizuka, Y. Higuchi, M. Hashimoto, and T. Onoye, ``Area Efficient Device-Parameter Estimation Using Sensitivity-Configurable Ring Oscillator,'' Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 731--736, January 2015.
[19]  M. Hashimoto, D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, T. Onoye, and H. Onodera, ``Reliability-Configurable Mixed-Grained Reconfigurable Array Compatible with High-Level Synthesis,'' Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 14--15, January 2015.
[20]  T. Amaki, M. Hashimoto, and T. Onoye, ``An Oscillator-Based True Random Number Generator with Process and Temperature Tolerance,'' Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 4--5, January 2015.
[21]  M. Hashimoto, ``Stochastic Verification of Run-Time Performance Adaptation with Field Delay Testing (Invited),'' Proceedings of Asia Pacific Conference on Circuits and Systems (APCCAS), pp. 751--754, November 2014.
[22]  M. Hashimoto, ``Opportunities and Verification Challenges of Run-Time Performance Adaptation (Invited),'' Proceedings of Asian Test Symposium (ATS), pp. 248--253, November 2014.
[23]  M. Hashimoto, ``Toward Robust Subthreshold Circuit Design: Variability and Soft Error Perspective (Invited),'' Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), October 2014.
[24]  A. Iokibe, M. Hashimoto, and T. Onoye, ``Feasibility Evaluation on an Instant Invader Detection System with Ultrasonic Sensors Scattered on the Ground,'' Proceedings of International Conference on Sensing Technology (ICST), pp. 188--193, September 2014.
[25]  T. Uemura, T. Kato, R. Tanabe, H. Iwata, J. Ariyoshi, H. Matsuyama, and M. Hashimoto, ``Optimizing Well-Configuration for Minimizing Single Event Latchup,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.
[26]  R. Harada, S. Hirokawa, and M. Hashimoto, ``Measurement of Alpha- and Neutron-Induced Seu and Mcu on Sotb and Bulk 0.4 V Srams,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.
[27]  T. Uemura, T. Kato, R. Tanabe, H. Iwata, H. Matsuyama, M. Hashimoto, K. Takahisa, M. Fukuda, and K. Hatanaka, ``Preventing Single Event Latchup with Deep P-Well on P-Substrate,'' Proceedings of International Reliability Physics Symposium (IRPS), June 2014.
[28]  M. Ueno, M. Hashimoto, and T. Onoye, ``Trace-Based Fault Localization with Supply Voltage Sensor,'' ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), March 2014.
[29]  Hiroaki Konoura, Dawood Alnajjar, Yukio Mitsuyama, Hiroyuki Ochi, Takashi Imagawa, Shinichi Noda, Kazutoshi Wakabayashi, Masanori Hashimoto, and Takao Onoye, ``Mixed-Grained Reconfigurable Architecture Supporting Flexible Reliability and C-Based Design,'' In ReConFig, December 2013.
[30]  D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, ``Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-To-Array Mapping and Its Radiation Testing,'' In Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pp. 313-316, November 2013.
[31]  T. Amaki, M. Hashimoto, and T. Onoye, ``A Process and Temperature Tolerant Oscillator-Based True Random Number Generator with Dynamic 0/1 Bias Correction,'' In Proceedings of Asian Solid-State Circuits Conference (A-SSCC), pp. 133-136, November 2013.
[32]  S. Iizuka, M. Mizuno, D. Kuroda, M. Hashimoto, and T. Onoye, ``Stochastic Error Rate Estimation for Adaptive Speed Control with Field Delay Testing,'' In Proc. International Conference on Computer-Aided Design (ICCAD), pp. 107-114, November 2013. (San Jose)
[33]  J. Kono, M. Hashimoto, and T. Onoye, ``Feasibility Evaluation of Near-Field Communication in Clay with 1-Mm^3 Antenna,'' Proceedings of Asia-Pacific Microwave Conference (APMC), pp. 1121--1123, November 2013.
[34]  R. Harada, M. Hashimoto, and T. Onoye, ``Nbti Characterization Using Pulse-Width Modulation,'' IEEE/ACM Workshop on Variability Modeling and Characterization, November 2013.
[35]  M. Hashimoto, ``Soft Error Immunity of Subthreshold Sram (Invited),'' Proceedings of IEEE International Conference on ASIC, pp. 91--94, October 2013.
[36]  T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Scaling Trend of Sram and Ff of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk Cmos Technology,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.
[37]  T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Soft-Error in Sram at Ultra Low Voltage and Impact of Secondary Proton in Terrestrial Environment,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.
[38]  T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Mitigating Multi-Cell-Upset with Well-Slits in 28nm Multi-Bit-Latch,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.
[39]  T. Shinada, M. Hashimoto, and T. Onoye, ``Proximity Distance Estimation Based on Capacitive Coupling between 1mm^3 Sensor Nodes,'' Proceedings of International NEWCAS Conference, June 2013.
[40]  M. Ueno, M. Hashimoto, and T. Onoye, ``Real-Time Supply Voltage Sensor for Detecting/Debugging Electrical Timing Failures,'' Proceedings of Reconfigurable Architectures Workshop (RAW), pp. 301--305, May 2013.
[41]  Y. Higuchi, K. Shinkai, M. Hashimoto, R. Rao, and S. Nassif, ``Extracting Device-Parameter Variations Using a Single Sensitivity-Configurable Ring Oscillator,'' Proceedings of IEEE European Test Symposium (ETS), pp. 106--111, May 2013.
[42]  M. Hashimoto, ``Robust Subthreshold Circuit Design to Manufacturing and Environmental Variability (Invited),'' China Semiconductor Technology International Conference (CSTIC), pp. 1079--1084, March 2013.
[43]  Jin Kono, Masanori Hashimoto, Takao Onoye, ``Feasibility Evaluation of Near-Field Communication in Clay with 1-Mm3 Antenna,'' Microwave Conference Proceedings (APMC), 2013 Asia-Pacific, pp. 1121-1123, 2013.
[44]  D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Static Voltage Over-Scaling and Dynamic Voltage Variation Tolerance with Replica Circuits and Time Redundancy in Reconfigurable Devices,'' Proceedings of International Conference on ReConFigurable Computing and FPGAs (ReConFig), December 2012.
[45]  I. Homjakovs, M. Hashimoto, T. Hirose, and T. Onoye, ``Signal-Dependent Analog-To-Digital Converter Based on Minimax Sampling,'' Proceedings of International SoC Design Conference (ISOCC), p. 120 -- 123 , November 2012.
[46]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Impact of Nbti-­Induced Pulse-Width Modulation on Set Pulse-Width Measurement,'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2012.
[47]  T. Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``A Predictive Delay Fault Avoidance Scheme for Coarse-Grained Reconfigurable Architecture,'' Proceedings of International Conference on Field Programmable Logic and Applications (FPL) , August 2012.
[48]  R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, ``Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' IEEE Nuclear and Space Radiation Effects Conference, July 2012.
[49]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Set Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects,'' Proceedings of International Reliability Physics Symposium (IRPS), April 2012.
[50]  K. Watanabe, G. Fujita, T. Homemoto, and R. Hashimoto, ``A High-Speed H.264/AVC CABAC Decoder for 4K Video Utilizing Residual Data Accelerator,'' The 17th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI 2012), pp. 6-10, March 2012.
[51]  S. Kimura, M. Hashimoto, and T. Onoye, ``Body Bias Clustering for Low Test-Cost Post-Silicon Tuning,'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 283--289, February 2012.
[52]  H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Implications of Reliability Enhancement Achieved by Fault Avoidance on Dynamically Reconfigurable Architectures,'' In Proc. 21st International Conference on Field Programmable Logic and Applications (FPL2011), Chania, Crete, Greece, pp. 189-194, September 2011.
[53]  Toshihiro Kameda, Hiroaki Konoura, Yukio Mitsuyama, Masanori Hashimoto, and Takao Onoye, ``Nbti Mitigation by Giving Random Scan-In Vectors during Standby Mode,'' In PATMOS2011, September 2011.
[54]  Y. Takai, M. Hashimoto, and T. Onoye, ``Power Gating Implementation for Noise Mitigation with Body-Tied Triple-Well Structure,'' In Proceedings of IEEE Custom Integrated Circuits Conference (CICC), September 2011.
[55]  M. Hashimoto and H. Fuketa, ``Adaptive Performance Compensation with On-Chip Variation Monitoring (Invited),'' In Proceedings of International Midwest Symposium on Circuits and Systems (MWSCAS), August 2011.
[56]  I. Homjakovs, M. Hashimoto, T. Hirose, and T. Onoye, ``Signal-Dependent Analog-To-Digital Conversion Based on Minimax Sampling,'' In Proceedings of International Midwest Symposium on Circuits and Systems (MWSCAS), August 2011.
[57]  T. Amaki, M. Hashimoto, and T. Onoye, ``An Oscillator-Based True Random Number Generator with Jitter Amplifier,'' In Proc. IEEE International Symposium on Circuits and Systems (ISCAS 2011), pp. 725-728, May 2011.
[58]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Neutron Induced Single Event Multiple Transients with Voltage Scaling and Body Biasing,'' In Proc. International Reliability Physics Symposium (IRPS), April 2011.
[59]  S. Kimura, M. Hashimoto, and T. Onoye, ``Body Bias Clustering for Low Test-Cost Post-Silicon Tuning,'' In ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 46--51, April 2011.
[60]  K. Shinkai, M. Hashimoto, and T. Onoye, ``Extracting Device-Parameter Variations with Ro-Based Sensors,'' In ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 13--18, March 2011.
[61]  D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Mttf Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability,'' In IEEE Workshop on Silicon Errors in Logic - System Effects, March 2011.
[62]  T. Amaki, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``A Design Procedure for Oscillator-Based Hardware Random Number Generator with Stochastic Behavior Modeling,'' In Proc. International Workshop on Information Security Applications (WISA 2010), pp. 107-121, January 2011.
[63]  T. Amaki, M. Hashimoto, and T. Onoye, ``Jitter Amplifier for Oscillator-Based True Random Number Generator,'' In Proc. Asia and South Pacific Design Automation Conference (ASP-DAC 2011), pp. 81-82, January 2011.
[64]  K. Shinkai and M. Hashimoto, ``Device-Parameter Estimation with On-Chip Variation Sensors Considering Random Variability,'' In Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 683-688, January 2011.
[65]  M. Hashimoto, ``Run-Time Adaptive Performance Compensation Using On-Chip Sensors (Invited),'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 285--290, January 2011.
[66]  M. Hatanaka, R. Hashimoto, T. Tatsuka, T. Onoye, H. Hatamoto, S. Ibi, S. Miyamoto, and S. Sampei, ``VLSI Design of OFDM Baseband Transceiver with Dynamic Spectrum Access,'' In Proc. of the 18th International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS2010), pp. 329-332, December 2010.
[67]  Y. Takai, M. Hashimoto, and T. Onoye, ``Evaluation of Power Gating Structures Focusing on Power Supply Noise with Measurement and Simulation,'' In Proceedings of IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS), pp. 213--216, October 2010.
[68]  T. Okumura and M. Hashimoto, ``Setup Time, Hold Time and Clock-To-Q Delay Computation under Dynamic Supply Noise,'' In Proceedings of IEEE Custom Integrated Circuits Conference (CICC), September 2010.
[69]  K. Shinkai and M. Hashimoto, ``Self-Heating in Nano-Scale Vlsi Interconnects,'' In Proceedings of International Workshop on Information Communication Technology (ICT), pp. S-1-6, August 2010.
[70]  S. Abe, K. Shinkai, M. Hashimoto, and T. Onoye, ``Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-Chip Sensors,'' In Proc. Great Lakes Symposium on VLSI (GLSVLSI), May 2010.
[71]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' In Proceedings of International Reliability Physics Symposium (IRPS), pp. 213--217, May 2010.
[72]  Y. Takai, Y. Ogasahara, M. Hashimoto, and T. Onoye, ``Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to Sso,'' In Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI), pp. 19--20, May 2010.
[73]  D. Kuroda, H. Fuketa, M. Hashimoto, and T. Onoye, ``A 16-Bit Risc Processor with 4.18pj/Cycle at 0.5v Operation,'' In Proceedings of IEEE COOL Chips, p. 190, April 2010.
[74]  H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Comparative Study on Delay Degrading Estimation Due to Nbti with Circuit/Instance/Transistor-Level Stress Probability Consideration,'' In Proc. International Symposium on Quality Electronic Design (ISQED), pp. 646-651, March 2010.
[75]  R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-Inverter-Delay Resolution,'' In Proc. International Symposium on Quality Electronic Design (ISQED), March 2010.
[76]  T. Enami, S. Ninomiya, K. Shinkai, S. Abe, and M. Hashimoto, ``Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 41-46, March 2010.
[77]  S. Abe, K. Shinkai, M. Hashimoto, and T. Onoye, ``Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-Chip Sensors,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), March 2010.
[78]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Adaptive Performance Control with Embedded Timing Error Predictive Sensors for Subthreshold Circuits,'' In Proc. Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 361-362, January 2010.
[79]  T. Okumura, F. Minami, K. Shimazaki, K. Kuwada, and M. Hashimoto, ``Gate Delay Estimation in Sta under Dynamic Power Supply Noise,'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), p. 775 -- 780, January 2010.
[80]  D. Alnajjar, Y. Ko, T. Imagawa, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, and T. Onoye, ``Soft Error Resilient Vlsi Architecture for Signal Processing,'' In Proceedings of IEEE International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS), pp. 183--186, December 2009.
[81]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Adaptive Performance Compensation with In-Situ Timing Error Prediction for Subthreshold Circuits,'' In Proc. IEEE Custom Integrated Circuits Conference, pp. 215-218, September 2009.
[82]  R. Hashimoto, T. Tatsuka, M. Hatanaka, T. Onoye, H. Hatamoto, S. Ibi, S. Miyamoto, and S. Sampei, ``Implementation of Ofdm Baseband Transceiver with Dynamic Spectrum Access for Cognitive Radio Systems,'' In Proc. of 9th International Symposium on Communication and Information Technology (ISCIT2009), pp. 658-663, September 2009.
[83]  S. Ninomiya and M. Hashimoto, ``Enhancement of Grid-Based Spatially-Correlated Variability Modeling for Improving Ssta Accuracy,'' In Proceedings of IEEE International SOC Conference (SOCC), pp. 337--340, September 2009.
[84]  K. Hamamoto, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Tuning-Friendly Body Bias Clustering for Compensating Random Variability in Subthreshold Circuits,'' In Proceedings of IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), pp. 51--56, August 2009.
[85]  D. Alnajjar, Y. Ko, T. Imagawa, H. Konoura, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, and T. Onoye, ``Coarse-Grained Dynamically Reconfigurable Architecture with Flexible Reliability,'' In Proceedings of International Conference on Field Programmable Logic and Applications (FPL), pp. 186--192, August 2009.
[86]  S. Watanabe, M. Hashimoto, and T. Sato, ``A Case for Exploiting Complex Arithmetic Circuits Towards Performance Yield Enhancement,'' In Proceedings of International Symposium on Quality Electronic Design (ISQED), pp. 401--407, March 2009.
[87]  Y. Ko, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Coarse-Grained Dynamically Reconfigurable Architecture with Flexible Reliability,'' In Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI), pp. 236--241, March 2009.
[88]  D. Alnajjar, Y. Ko, T. Imagawa, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, and T. Onoye, ``A Coarse-Grained Dynamically Reconfigurable Architecture Enabling Flexible Reliability,'' In Proceedings of IEEE Workshop on System Effects of Logic Soft Errors (SELSE), March 2009.
[89]  K. Shinkai and M. Hashimoto, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 79-84, February 2009.
[90]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Trade-Off Analysis between Timing Error Rate and Power Dissipation for Adaptive Speed Control with Timing Error Prediction,'' In Proc. Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 266-271, January 2009.
[91]  L. Zhang, Y. Zhang, A. Tsuchiya, M. Hashimoto, E. Kuh, and C-K Cheng, ``High Performance On-Chip Differential Signaling Using Passive Compensation for Global Communication,'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 385--390, January 2009.
[92]  T. Enami, M. Hashimoto, and T. Sato, ``Decoupling Capacitance Allocation for Timing with Statistical Noise Model and Timing Analysis,'' In Proc. IEEE/ACM International Conference on Computer-Aided Design, pp. 420-425, November 2008.
[93]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-Biased Circuits and Subthreshold Circuits,'' In ICCAD Colocated Workshop on Test Structure Design for Variability Characterization, November 2008.
[94]  Y. Ogasahara, M. Hashimoto, T. Kanamoto, and T. Onoye, ``Measurement of Supply Noise Suppression by Substrate and Deep N-Well in 90nm Process,'' In Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pp. 397--400, November 2008.
[95]  Y. Zhang, L. Zhang, A. Tsuchiya, M. Hashimoto, and C.-K. Cheng, ``On-Chip High Performance Signaling Using Passive Compensation,'' In Proceedings of IEEE International Conference on Computer Design (ICCD), pp. 182-187, October 2008.
[96]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits,'' In Proc. IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), pp. 3-8, August 2008.
[97]  S. Watanabe, M. Hashimoto, and T. Sato, ``Cascading Dependent Operations for Mitigating Timing Variability,'' In Proceedings. of Workshop on Quality-Aware Design (W-QUAD), June 2008.
[98]  S. Takahashi, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, ``A Design Method of Finding Optimal Sampling Pulse and Transistor Size in a Sampling Circuit for Liquid Crystal Displays,'' In In Proceedings of International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC), June 2008.
[99]  K. Hamamoto, H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Experimental Study on Body-Biasing Layout Style - Negligible Area Overhead Enables Sufficient Speed Controllability -,'' In ACM Great Lakes Symposium on VLSI, pp. 387-390, May 2008.
[100]  T. Enami, S. Ninomiya, and M. Hashimoto, ``Statistical Timing Analysis Considering Spatially and Temporally Correlated Dynamic Power Supply Noise,'' In Proc. ACM International Symposium on Physical Design, pp. 160-167, April 2008.
[101]  S. Abe, M. Hashimoto, and T. Onoye, ``Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution,'' In Proc. International Symposium on Quality Electronic Design (ISQED), pp. 520-525, March 2008.
[102]  Y. Ogasahara, M. Hashimoto, and T. Onoye, ``Dynamic Supply Noise Measurement Circuit Composed of Standard Cells Suitable for In-Site Soc Power Integrity Verification,'' In Proc. IEEE/ACM Asia and South Pacific Design Automation Conference, pp. 107-108, January 2008.
[103]  L. Zhang, J. Liu, H. Zhu, C-K Cheng, and M. Hashimoto, ``High Performance Current-Mode Differential Logic,'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 720--725, January 2008.
[104]  R. Hashimoto, K. Kato, G. Fujta, and T. Onoye, ``VLSI Architecture of H.264 RDO-Based Block Size Decision for 1080 HD,'' In Proc. PCS, November 2007.
[105]  R. Hashimoto, T. Matsumura, Y. Nozato, K. Watanabe, and T. Onoye, ``Implementation of Object Attention Based on Multi-Agent Attractor Selection,'' In Proc. SISB, November 2007.
[106]  K.Hamamoto, H.Fuketa, M.Hashimoto, Y.Mitsuyama, and T.Onoye, ``A Study on Body-Biasing Layout Style Focusing on Area Efficiency and Speed Controllability,'' In Proc. Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI 2007), pp. 233-237, October 2007.
[107]  Y. Ogasahara, M. Hashimoto, and T. Onoye, ``Dynamic Supply Noise Measurement with All Digital Gated Oscillator for Evaluating Decoupling Capacitance Effect,'' In Proc. IEEE Custom Integrated Circuits Conference, pp. 783-786, September 2007.
[108]  T. Kanamoto, Y. Ogasahara, K. Natsume, K. Yamaguchi, H. Amishiro, T. Watanabe, and M. Hashimoto, ``Impact of Well Edge Proximity Effect on Timing,'' In Proc. IEEE European Solid-State Device Research Conference, pp. 115-118, September 2007.
[109]  M. Hashimoto, J. Siriporn, A. Tsuchiya, H. Zhu, and C.-K. Cheng, ``Analytical Eye-Diagram Model for On-Chip Distortionless Transmission Lines and Its Application to Design Space Exploration,'' In Proc. IEEE Custom Integrated Circuits Conference, pp. 869-872, September 2007.
[110]  K. Shinkai, M. Hashimoto, and T. Onoye, ``Future Prediction of Self-Heating in Short Intra-Block Wires,'' In Proc. International Symposium on Quality Electronic Design (ISQED), pp. 660-665, March 2007.
[111]  R. Hashimoto, K. Kato, G. Fujta, and T. Onoye, ``VLSI Architecture of H.264 Block Size Decision Based on Rate-Distortion Optimization,'' In Proc. ISPACS, pp. 618--621, December 2006.
[112]  K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Conference on Computer-Aided Design (ICCAD), pp. 47-53, November 2006.
[113]  Y. Ogasahara, M. Hashimoto, and T. Onoye, ``Quantitative Prediction of On-Chip Capacitive and Inductive Crosstalk Noise and Discussion on Wire Cross-Sectional Area Toward Inductive Crosstalk Free Interconnects,'' Proc. IEEE International Conference on Computer Design, pp. 70--75, October 2006.
[114]  Y. Ogasahara, M. Hashimoto, and T. Onoye, ``Measurement of Inductive Coupling Effect on Timing in 90nm Global Interconnects,'' In Proc. IEEE Custom Integrated Circuits Conference, pp. 721--724, September 2006.
[115]  Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, and T. Onoye, ``Measurement Results of Delay Degradation Due to Power Supply Noise Well Correlated with Full-Chip Simulation,'' In Proc.~IEEE Custom Integrated Circuits Conference, pp. 861--864, September 2006.
[116]  T. Ijichi, M. Hashimoto, S. Takahashi, S. Tsukiyama, and I. Shirakawa, ``Transistor Sizing of Lcd Driver Circuit for Technology Migration,'' In Proceedings of International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC), vol. 1, p. I25--I28, July 2006.
[117]  T. Kanamoto, T. Ikeda, A. Tsuchiya, H. Onodera, and M. Hashimoto, ``Si-Substrate Modeling Toward Substrate-Aware Interconnect Resistance and Inductance Extraction in Soc Design,'' In Proceedings of IEEE Wrokshop on Signal Propagation on Interconnects (SPI), pp. 227--230, May 2006.
[118]  K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 59-64, February 2006.
[119]  T. Kanamoto, T. Ikeda, A. Tsuchiya, H. Onodera, and M. Hashimoto, ``Effective Si-Substrate Modeling for Frequency-Dependent Interconnect Resistance and Inductance Extraction,'' In The 3rd International Workshop on Compact Modeling, pp. 51--56, January 2006.
[120]  A. Tsuchiya, M. Hashimoto, and H. Onodera, ``Interconnect Rl Extraction at a Single Representative Frequency,'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 515-520, January 2006.
[121]  S. Takahashi, A. Taji, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, ``A Sampling Switch Design for Liquid Crystal Displays,'' In Proceedings of IEEE International Region 10 Conference, November 2005.
[122]  T. Kouno, M. Hashimoto, and H. Onodera, ``Input Capacitance Modeling of Logic Gates for Accurate Static Timing Analysis,'' In Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pp. 453-456, November 2005.
[123]  M. Hashimoto, A. Tsuchiya, A. Shinmyo, and H. Onodera, ``Performance Prediction of On-Chip High-Throughput Global Signaling,'' In Proceedings of IEEE 14th Topical Meeting on Electrical Performance of Electronic Packaging (EPEP), pp. 79-82, October 2005.
[124]  Y. Ogasahara, M. Hashimoto, and T. Onoye, ``Measurement and Analysis of Delay Variation Due to Inductive Coupling,'' In Proc. IEEE Custom Integrated Circuits Conference, pp. 305--308, September 2005.
[125]  A. Tsuchiya, M. Hashimoto, and H. Onodera, ``Design Guideline for Resistive Termination of On-Chip High-Speed Interconnects,'' In Proceedings of IEEE Custom Integrated Circuits Conference (CICC), pp. 613-616, September 2005.
[126]  S. Takahashi, A. Taji, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, ``A Design Scheme for Sampling Switch in Active Matrix Lcd,'' In A Design Scheme for Sampling Switch in Active Matrix LCD, August 2005.
[127]  A. Tsuchiya, M. Hashimoto, and H. Onodera, ``Substrate Loss of On-Chip Transmission-Lines with Power/Ground Wires in Lower Layer,'' In Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI), Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI), May 2005.
[128]  Y. Uchida, S. Tani, M. Hashimoto, S. Tsukiyama, and I. Shirakawa, ``Interconnect Capacitance Extraction for System LCD Circuits,'' In in Proc. IEEE/ACM Great Lake Symposium on Very Large Scale Integrated circuits (GLSVLSI 2005), pp. 160--163, April 2005.
[129]  A. Tsuchiya, M. Hashimoto, and H. Onodera, ``Effects of Orthogonal Power/Ground Wires on On-Chip Interconnect Characteristics,'' In Proceedings of International Meeting for Future of Electron Devices, Kansai, pp. 33-34, April 2005.
[130]  A. Muramatsu, M. Hashimoto, and H. Onodera, ``Effects of On-Chip Inductance on Power Distribution Grid,'' In Proceedings of International Symposium on Physical Design (ISPD), pp. 63-69, April 2005.
[131]  M. Hashimoto, T. Yamamoto, and H. Onodera, ``Statistical Analysis of Clock Skew Variation in H-Tree Structure,'' In Proceedings of International Symposium on Quality Electronic Design (ISQED), pp. 402-407, March 2005.
[132]  T. Sato, M. Hashimoto, and H. Onodera, ``Successive Pad Assignment Algorithm to Optimize Number and Location of Power Supply Pad Using Incremental Matrix Inversion,'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 723-728, January 2005.
[133]  M. Hashimoto, J. Yamaguchi, T. Sato, and H. Onodera, ``Timing Analysis Considering Temporal Supply Voltage Fluctuation,'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 1098-1101, January 2005.
[134]  A. Tsuchiya, M. Hashimoto, and H. Onodera, ``Return Path Selection for Loop Rl Extraction,'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 1078-1081, January 2005.
[135]  T. Sato, N. Ono, J. Ichimiya, K. Hachiya, and M. Hashimoto, ``On-Chip Thermal Gradient Analysis and Temperature Flattening for Soc Design,'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 1074-1077, January 2005.
[136]  A. Shinmyo, M. Hashimoto, and H. Onodera, ``Design and Measurement of 6.4 Gbps 8:1 Multiplexer in 0.18um Cmos Process,'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), p. D9-D10, January 2005.
[137]  S. Takahashi, A. Taji, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, ``A Sampling Switch Design for Liquid Crystal Displays,'' In Proceedings of IEEE International Region 10 Conference, 1C-03.3, 2005.
[138]  S. Takahashi, A. Taji, S. Tsukiyama, M. Hashimoto, and I. Shirakawa, ``A Design Scheme for Sampling Switch in Active Matrix LCD,'' In Proceedings of European Conference on Circuit Theory and Design, 3e-212, 2005.
[139]  M. Hashimoto, A. Tsuchiya, A. Shinmyo, and H. Onodera, ``Performance Prediction of On-Chip Global Signaling,'' In IEEE Electrical Design of Advanced Packaging and Systems (EDAPS) , pp. 87-100, November 2004.
[140]  M. Hashimoto, J. Yamaguchi, and H. Onodera, ``Timing Analysis Considering Spatial Power/Ground Level Variation,'' In Proceedings of ACM/IEEE International Conference on Computer-Aided Design (ICCAD), pp. 814-820, November 2004.
[141]  M. Hashimoto, A. Tsuchiya, and H. Onodera, ``On-Chip Global Signaling by Wave Pipelining,'' In IEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging (EPEP), pp. 311-314, October 2004.
[142]  A. Muramatsu, M. Hashimoto, and H. Onodera, ``Lsi Power Network Analysis with On-Chip Wire Inductance,'' In Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI), pp. 55-60, October 2004.
[143]  T. Sato, M. Hashimoto, and H. Onodera, ``An Ir-Drop Minimization by Optimizing Number and Location of Power Supply Pads,'' In Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI), pp. 66-72, October 2004.
[144]  M. Hashimoto, T. Yamamoto, and H. Onodera, ``Statistical Analysis of Clock Skew Variation,'' In Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI), pp. 214-219, October 2004.
[145]  T. Miyazaki, M. Hashimoto, and H. Onodera, ``A Performance Prediction of Clock Generation Plls: a Ring Oscillator Based Pll and an Lc Oscillator Based Pll,'' In IEEJ International Analog VLSI Workshop, pp. 45-50, October 2004.
[146]  A. Tsuchiya, M. Hashimoto, and H. Onodera, ``Performance Limitation of On-Chip Global Interconnects for High-Speed Signaling,'' In Proceedings of IEEE Custom Integrated Circuits Conference (CICC), pp. 489-492, September 2004.
[147]  A. Shinmyo, M. Hashimoto, and H. Onodera, ``Design and Optimization of Cmos Current Mode Logic Dividers,'' In IEEE Asia-Pacific Conference on Advanced System Integrated Circuits , pp. 434-435, August 2004.
[148]  S. Hashimoto, A. Niwa, H. Okuhata, T. Onoye, and I. Shirakawa, ``VLSI Implementation of Portable MPEG-4 Audio Decoder,'' In in Proc. International ASIC/SOC Conference (ASIC/SOC 2000), Arington, VA, USA, pp. 80--84, September 2000.
国内会議(査読付き)
[1]  小島康介, 橋本亮司, 藤田玄, ``H.264 向け量子化パラメータを考慮した動きベクトル検出手法の一検討,'' 第22回 回路とシステム軽井沢ワークショップ , pp. 142-147, April 2009.
研究会等発表論文
[1]  白井 僚,廣瀬 哲也,橋本 昌宜, ``超小型IoTノード向けアンテナ組み込み型OOKトランスミッタの実装と評価,'' 第45回アナログRF研究会, p. 2, March 2017.
[2]  S. Iizuka, Y. Higuchi, M. Hashimoto, and T. Onoye, ``Area Efficient Device-Parameter Estimation Using Sensitivity-Configurable Ring Oscillator,'' 電子情報通信学会 VLSI設計技術研究会, March 2015.
[3]  郡浦 宏明, 今川 隆司, 密山 幸男, 橋本 昌宜, 尾上 孝雄, ``動作合成に対応した信頼性可変混合粒度再構成可能アーキテクチャの検討,'' 信学技報, RECONF2013-8, vol. 113, no. 52, pp. 41-46, May 2013.
[4]  天木 健彦, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``確率的動作モデルを用いたオシレータベース真性乱数生成回路のワーストケース設計手法,'' 信学技報, VLD2012-154, vol. 112, no. 451, pp. 099-104, March 2013.
[5]  郡浦 宏明, 今川 隆司, 密山 幸男, 橋本 昌宜, 尾上 孝雄, ``動的部分再構成による故障回避に関する一考察,'' 信学技報, RECONF2012-59 , vol. 112, no. 325, pp. 71-76, November 2012.
[6]  天木 健彦, 橋本 昌宜, 尾上 孝雄, ``ゆらぎ増幅回路を用いたオシレータベース物理乱数生成器,'' 信学技報, ICD2011-118, vol. 111, no. 352, pp. 087-092, December 2011.
[7]  亀田 敏広, 郡浦 宏明, 密山 幸男, 橋本 昌宜, 尾上 孝雄, ``スキャンパスを用いたNBTI劣化抑制に関する研究,'' 情報処理学会DAシンポジウム, pp. 201-206, August 2011.
[8]  郡浦 宏明, 密山 幸男, 橋本 昌宜, 尾上 孝雄, ``動的再構成可能アーキテクチャによる故障回避機構の定量的評価,'' 信学技報, RECONF2011-6, vol. 111, no. 31, pp. 31-36, May 2011.
[9]  天木 健彦, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``確率的動作モデルを用いたオシレータベース物理乱数生成器の設計手法,'' 情報処理学会研究報告, SLDM2010-147, vol. 2010-SLDM-147, no. 19, pp. 1-6, November 2010.
[10]  榎並 孝司, 木村 修太, 橋本 昌宜, 尾上 孝雄, ``自己性能補償に向けたカナリアFF挿入手法,'' 情報処理学会DAシンポジウム, pp. 227-232, September 2010.
[11]  高井 康充, 橋本 昌宜, 尾上 孝雄, ``電源ノイズに注目した電源遮断法の実機評価,'' , no. 信学技報 vol.110, No344, 電子情報通信学会(IEICE), 2010.
[12]  黒田 弾, 更田 裕司, 橋本 昌宜, 尾上 孝雄, ``低エネルギー動作に適した超低電圧プロセッサのアーキテクチャ評価,'' 情報処理学会第141回システムLSI設計技術研究会, pp107-112, October 2009.
[13]  新開 健一, 橋本 昌宜, ``広範囲な製造・環境ばらつきに対応したゲート遅延モデル,'' 情報処理学会DAシンポジウム, pp. 73-78, August 2009.
[14]  郡浦 宏明, 密山 幸男, 橋本 昌宜, 尾上 孝雄, ``NBTI による劣化予測におけるトランジスタ動作確率算出法の評価,'' 情報処理学会DAシンポジウム, pp. 181-186, August 2009.
[15]  橋本 昌宜, 榎並 孝司, 新開 健一, 二宮 進有, 阿部 慎也, ``電源ノイズや製造ばらつきによるクロックジッタ・スキューを考慮した統計的タイミング解析,'' 情報処理学会DAシンポジウム, pp. 79-84, August 2009.
[16]  天木 健彦, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``マルコフモデルによるオシレータサンプリング方式真性乱数生成器の乱数品質解析,'' 第22回回路とシステム軽井沢ワークショップ, pp. 474-479, April 2009.
[17]  達可敏充, 橋本亮司, 渡邊賢治, 畠中理英, 尾上孝雄, ``ダイナミックスペクトルアクセスを用いたコグニティブ無線ネットワークにおけるノード位置推定手法の一検討,'' 信学技報, IN2008-220, vol. 108, no. 458, pp. 523-528, March 2009.
[18]  濱本 浩一, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``レイアウトを考慮した基板バイアスクラスタリング手法,'' 信学技報, VLD2008-159 , vol. 108, no. 478, pp. 195-200, March 2009.
[19]  榎並 孝司, 橋本 昌宜, 佐藤 高史, ``電源ノイズ考慮統計的タイミング解析を用いたデカップリング容量割当手法,'' 信学技報, VLD2008-161, vol. 108, no. 478, pp. 207-212, March 2009.
[20]  更田 裕司, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``サブスレッショルド回路における基板バイアスを考慮したトランジスタのばらつきモデリングとリングオシレータを用いた検証,'' 信学技報, VLD2008-159, vol. 108, no. 478, pp. 201-206, March 2009.
[21]  橋本亮司, 筒井 弘, 尾上孝雄, 猪飼知宏, ``DCT領域 Distributed Video Coding における尤度推定手法,'' 信学技報, IE2008-209, vol. 108, no. 425, pp. 31-36, February 2009.
[22]  小島康介, 橋本亮司, 藤田玄, ``H.264向けRDOに基づいた動きベクトル検出手法の一検討,'' 電子情報通信学会技術研究報告, SIP2008-99, vol. 104, no. 213, pp. 53-58, September 2008.
[23]  更田 裕司, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``タイミングエラー予告を用いた適応的速度制御におけるタイミングエラー頻度と消費電力のトレードオフ解析,'' 情報処理学会DAシンポジウム, pp. 217-222, August 2008.
[24]  濱本 浩一, 更田 裕司, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``基板バイアス印加レイアウト方式の面積効率と速度制御性の評価,'' 信学技報, CAS2008-14, VLD2008-27, SIP2008-48(2008-6), pp. 75-79, June 2008.
[25]  小笠原泰弘, 橋本昌宜, 尾上孝雄, ``バス配線による誘導性クロストークノイズによる遅延変動の実測とノイズ重ねあわせ効果の検証,'' , 信学技報, VLD2007-153, March 2008.
[26]  小笠原 泰弘, 橋本 昌宜, 尾上 孝雄, ``スタンダードセルで構成された電源ノイズ波形測定回路の提案,'' 信学技報, CPM2007-131, ICD2007-142, pp. 17-22, January 2008.
[27]  二宮 進有, 橋本 昌宜, ``SSTAにおける空間的相関を持つ製造ばらつきのグリッドベースモデル化法の検討,'' 信学技報, VLD2007-91, DC2007-46, vol. 107, no. 336, pp. 13-17, November 2007.
[28]  橋本亮司, 加藤公也, 才辻誠, 田中照人, 上津寛和, 藤田玄, 尾上孝雄, ``1080HD向けマルチシンボルH.264エントロピー復号器,'' 第21回ディジタル信号処理シンポジウム, November 2007.
[29]  加藤 公也, 橋本 亮司, 藤田 玄, 尾上 孝雄, ``H.264 High ProfileにおけるマルチシンボルCABAC復号器のアーキテクチャ検討,'' 信学技報, SIP2007-121, ICD2007-110, IE2007-80, pp. 65-70, October 2007.
[30]  橋本 昌宜, ``製造・環境ばらつきを考慮したタイミング検証技術,'' 信学技報, VLD2007-65, pp. 21-24, October 2007.
[31]  阿部 慎也, 橋本 昌宜, 尾上 孝雄, ``製造ばらつきを考慮したメッシュ型クロック分配網のスキュー評価,'' 情報処理学会DAシンポジウム, pp. 133-138, August 2007.
[32]  新開 健一, 橋本 昌宜, 尾上 孝雄, ``短距離ブロック内配線の自己発熱,'' 第 20 回 回路とシステム軽井沢ワークショップ, pp. 7-12, April 2007.
[33]  榎並 孝司, 二宮 進有, 橋本 昌宜, ``電源ノイズの空間的相関を考慮した統計的タイミング解析,'' 第20回 回路とシステム軽井沢ワークショップ, pp. 667-672, April 2007.
[34]  橋本 昌宜, ``製造・環境ばらつきと動的性能補償を考慮したタイミング検証に向けて,'' 第20回 回路とシステム(軽井沢)ワークショップ, pp. 661-666, April 2007.
[35]  小笠原 泰弘, 橋本 昌宜, 尾上 孝雄, ``90nm グローバル配線における誘導性クロストークノイズによる遅延変動の実測,'' 信学技報, CPM2006-131, ICD2006-173, pp. 13--18, January 2007.
[36]  小笠原 泰弘, 榎並 孝司, 橋本 昌宜, 佐藤 高史, 尾上 孝雄, ``電源ノイズによる遅延変動の測定と電源ノイズを再現するフルチップシミュレーション手法,'' 信学技報, CPM2006-132, ICD2006-174, pp. 19--23, January 2007.
[37]  橋本 亮司, 藤田 玄, 尾上 孝雄, ``H.264符号化における演算量動的割当ての一手法,'' 第21回ディジタル信号処理シンポジウム, D8-1, November 2006.
[38]  Jangsombatsiri Siriporn, 橋本 昌宜, 尾上 孝雄, ``シャントコンダクタンスを挿入したオンチップ伝送線路特性評価,'' 第十回シリコンアナログRF研究会, November 2006.
[39]  榎並 孝司, 橋本 昌宜, 尾上 孝雄, ``主成分分析による電源電圧変動の統計的モデル化手法,'' 情報処理学会DAシンポジウム, pp. 205--210, July 2006.
[40]  新開 健一, 橋本 昌宜, 黒川 敦, 尾上孝雄, ``電流変動に着目した広範囲な製造・環境ばらつき対応ゲート遅延モデル,'' 第19回 回路とシステム軽井沢ワークショップ, pp. 559-564, April 2006.
[41]  小笠原泰弘, 橋本昌宜, 尾上孝雄, ``LSI配線における容量性, 誘導性クロストークノイズの定量的将来予測,'' 第19回回路とシステム軽井沢ワークショップ, pp. 5--10, April 2006.
[42]  伊地知孝仁, 橋本昌宜, 高橋真吾, 築山修治, 白川功, ``画素充電率制約を満足する液晶ドライバ回路のトランジスタサイズ決定技術,'' 信学技報, VLD2005-131, pp. 55--60, March 2006.
[43]  小笠原泰弘, 橋本昌宜, 尾上孝雄, ``誘導性・容量性クロストークノイズによる遅延変動の測定と評価,'' 信学技報, SDM2005-135, ICD2005-74, pp. 43--48, August 2005.
[44]  内田 好弘, 谷 貞宏, 橋本 昌宜, 築山 修治, 白川 功, ``システム液晶のための配線間容量抽出手法,'' 信学技報, VLD2004-64, pp. 19--24, December 2004.
[45]  丹羽 章雅, 橋本 晋弥, 奥畑 宏之, 尾上 孝雄, 白川 功, ``携帯用 MPEG-4 オーディオデコーダの VLSI 化設計,'' 第14回ディジタル信号処理シンポジウム, pp. 629--634, November 1999.
著書
[1]  M. Hashimoto and R. Nair, ``Power Integrity for Nanoscale Integrated Systems,'' McGraw-Hill Professional, February 2014.
大会等発表論文
[1]  橋本 亮司, 達可 敏充, 畠中 理英, 尾上 孝雄, 畑本 浩伸, 衣斐 信介, 宮本 伸一, 三瓶 政一, ``ダイナミックスペクトルアクセスを用いたOFDM無線送受信機のFPGA実装,'' 電子情報通信学会総合大会, AS-2-2, March 2010.
[2]  中村 秀幸, 筒井 弘, 橋本 亮司, 尾上 孝雄, ``特徴点追跡を用いた動き補償フレーム補間手法,'' 電子情報通信学会2009ソサイエティ大会, A-20-14, p. 204, September 2009.
[3]  橋本 亮司, 加藤 公也, 藤田 玄, 尾上 孝雄, ``H.264 CABAC復号器の高速化に関する一検討,'' 電子情報通信学会2008ソサイエティ大会,A-20-9, September 2008.
[4]  橋本亮司, 藤田玄, 尾上孝雄, ``1080HD向けH.264 CAVLC復号器の高速化に関する一検討,'' 電子情報通信学会2007ソサイエティ大会,A-20-16, September 2007.
[5]  榎並 孝司, 橋本 昌宜, ``統計的電源ノイズモデル化に適した適応的領域分割法,'' 電子情報通信学会ソサイエティ大会, pp. A-3-10, September 2007.
[6]  河村 侑輝, 橋本 亮司, 尾上孝雄, ``H.264符号化における1/4画素精度動き検出の性能評価,'' 電子情報通信学会2007ソサイエティ大会,A-4-28, September 2007.
[7]  橋本亮司, 松村友哉, 野里良裕, 渡邊賢治, 尾上孝雄, ``複眼光学系による物体注視システムのハードウェア実現,'' 第9回 DSPS教育者会議 予稿集, pp. 87-88, August 2007.
[8]  二宮 進有, 橋本 昌宜, ``空間的相関を考慮したSSTAにおける領域の分割数と精度,'' 電子情報通信学会総合大会, A-3-1 , March 2007.
[9]  濱本 浩一, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``低電圧回路向け基板電位制御レイアウト方式の面積効率評価,'' 電子情報通信学会総合大会, A-3-6, March 2007.
[10]  阿部 慎也, 橋本 昌宜, 尾上 孝雄, ``メッシュ型クロック分配網のスキュー評価,'' 電子情報通信学会総合大会, A-3-5, March 2007.
[11]  更田 裕司, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``加算器を用いたsubthreshold 回路の設計指針の検討,'' 電子情報通信学会総合大会, A-3-17, March 2007.
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