論文誌
[1]  K. Shinkai, M. Hashimoto, and T. Onoye, ``A Gate-Delay Model Focusing on Current Fluctuation Over Wide Range of Process-Voltage-Temperature Variations,'' Integration, the VLSI Journal, vol. 46, no. 4, pp. 345--358, September 2013.
[2]  K. Shinkai, M. Hashimoto, and T. Onoye, ``Extracting Device-Parameter Variations with Ro-Based Sensors,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E94-A, no. 12, pp. 2537--2544, December 2011.
[3]  T. Enami, S. Ninomiya, K. Shinkai, S. Abe, and M. Hashimoto, ``Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation,'' IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, vol. 93-A, no. 12, pp. 2399-2408, December 2010.
[4]  K. Shinkai, M. Hashimoto, and T. Onoye, ``Prediction of Self-Heating in Short Intra-Block Wires,'' IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, vol. E93-A, no. 3, pp. 583-594, March 2010.
国際会議
[1]  Y. Higuchi, K. Shinkai, M. Hashimoto, R. Rao, and S. Nassif, ``Extracting Device-Parameter Variations Using a Single Sensitivity-Configurable Ring Oscillator,'' Proceedings of IEEE European Test Symposium (ETS), pp. 106--111, May 2013.
[2]  K. Shinkai, M. Hashimoto, and T. Onoye, ``Extracting Device-Parameter Variations with Ro-Based Sensors,'' In ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 13--18, March 2011.
[3]  K. Shinkai and M. Hashimoto, ``Device-Parameter Estimation with On-Chip Variation Sensors Considering Random Variability,'' In Proceedings of IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 683-688, January 2011.
[4]  K. Shinkai and M. Hashimoto, ``Self-Heating in Nano-Scale Vlsi Interconnects,'' In Proceedings of International Workshop on Information Communication Technology (ICT), pp. S-1-6, August 2010.
[5]  S. Abe, K. Shinkai, M. Hashimoto, and T. Onoye, ``Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-Chip Sensors,'' In Proc. Great Lakes Symposium on VLSI (GLSVLSI), May 2010.
[6]  T. Enami, S. Ninomiya, K. Shinkai, S. Abe, and M. Hashimoto, ``Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 41-46, March 2010.
[7]  S. Abe, K. Shinkai, M. Hashimoto, and T. Onoye, ``Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-Chip Sensors,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), March 2010.
[8]  K. Shinkai and M. Hashimoto, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 79-84, February 2009.
[9]  K. Shinkai, M. Hashimoto, and T. Onoye, ``Future Prediction of Self-Heating in Short Intra-Block Wires,'' In Proc. International Symposium on Quality Electronic Design (ISQED), pp. 660-665, March 2007.
[10]  K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Conference on Computer-Aided Design (ICCAD), pp. 47-53, November 2006.
[11]  K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 59-64, February 2006.
研究会等発表論文
[1]  新開 健一, 橋本 昌宜, ``広範囲な製造・環境ばらつきに対応したゲート遅延モデル,'' 情報処理学会DAシンポジウム, pp. 73-78, August 2009.
[2]  橋本 昌宜, 榎並 孝司, 新開 健一, 二宮 進有, 阿部 慎也, ``電源ノイズや製造ばらつきによるクロックジッタ・スキューを考慮した統計的タイミング解析,'' 情報処理学会DAシンポジウム, pp. 79-84, August 2009.
[3]  新開 健一, 橋本 昌宜, 尾上 孝雄, ``短距離ブロック内配線の自己発熱,'' 第 20 回 回路とシステム軽井沢ワークショップ, pp. 7-12, April 2007.
[4]  新開 健一, 橋本 昌宜, 黒川 敦, 尾上孝雄, ``電流変動に着目した広範囲な製造・環境ばらつき対応ゲート遅延モデル,'' 第19回 回路とシステム軽井沢ワークショップ, pp. 559-564, April 2006.
大会等発表論文
[1]  新開 健一, 橋本 昌宜, 尾上 孝雄, ``短距離ブロック内配線の自己発熱問題の将来予測,'' 電子情報通信学会ソサイエティ大会, pp. A-3-14, September 2006.

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