国際会議
[1]  S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, ``Neutron-Induced Seu and Mcu Rate Characterization and Analysis of Sotb and Bulk Srams at 0.3v Operation,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.

This site is maintained by Onoye Lab.

PMAN 2.5.5 - Paper MANagement system / (C) 2002-2008, Osamu Mizuno / All rights reserved.