論文誌
[1]  T. Sato, J. Ichimiya, N. Ono, and M. Hashimoto, ``On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E89-A, no. 12, pp. 3491-3499, December 2006.
[2]  T. Sato, J. Ichimiya, N. Ono, K. Hachiya, and M. Hashimoto, ``On-Chip Thermal Gradient Analysis and Temperature Flattening for Soc Design,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E88-A, no. 12, pp. 3382-3389, December 2005.
国際会議
[1]  T. Sato, N. Ono, J. Ichimiya, K. Hachiya, and M. Hashimoto, ``On-Chip Thermal Gradient Analysis and Temperature Flattening for Soc Design,'' In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 1074-1077, January 2005.

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