論文誌
[1]  H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Stress Probability Computation for Estimating NBTI-Induced Delay Degradation,'' IEICE Trans. Fundamentals, vol. E94-A, no. 12, pp. 2545-2553, December 2011.
国際会議
[1]  Hiroaki Konoura, Dawood Alnajjar, Yukio Mitsuyama, Hiroyuki Ochi, Takashi Imagawa, Shinichi Noda, Kazutoshi Wakabayashi, Masanori Hashimoto, and Takao Onoye, ``Mixed-Grained Reconfigurable Architecture Supporting Flexible Reliability and C-Based Design,'' In ReConFig, December 2013.
[2]  H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Implications of Reliability Enhancement Achieved by Fault Avoidance on Dynamically Reconfigurable Architectures,'' In Proc. 21st International Conference on Field Programmable Logic and Applications (FPL2011), Chania, Crete, Greece, pp. 189-194, September 2011.
[3]  Toshihiro Kameda, Hiroaki Konoura, Yukio Mitsuyama, Masanori Hashimoto, and Takao Onoye, ``Nbti Mitigation by Giving Random Scan-In Vectors during Standby Mode,'' In PATMOS2011, September 2011.
[4]  H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Comparative Study on Delay Degrading Estimation Due to Nbti with Circuit/Instance/Transistor-Level Stress Probability Consideration,'' In Proc. International Symposium on Quality Electronic Design (ISQED), pp. 646-651, March 2010.
研究会等発表論文
[1]  郡浦 宏明, 今川 隆司, 密山 幸男, 橋本 昌宜, 尾上 孝雄, ``動作合成に対応した信頼性可変混合粒度再構成可能アーキテクチャの検討,'' 信学技報, RECONF2013-8, vol. 113, no. 52, pp. 41-46, May 2013.
[2]  郡浦 宏明, 今川 隆司, 密山 幸男, 橋本 昌宜, 尾上 孝雄, ``動的部分再構成による故障回避に関する一考察,'' 信学技報, RECONF2012-59 , vol. 112, no. 325, pp. 71-76, November 2012.
[3]  郡浦 宏明, 密山 幸男, 橋本 昌宜, 尾上 孝雄, ``動的再構成可能アーキテクチャによる故障回避機構の定量的評価,'' 信学技報, RECONF2011-6, vol. 111, no. 31, pp. 31-36, May 2011.

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