論文誌
[1]  H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, ``Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10t Subthreshold Sram,'' IEEE Transactions on Device and Materials Reliability, vol. 14, no. 1, p. 463 -- 470, March 2014.
[2]  R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, ``Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' IEEE Transactions on Nuclear Science, vol. 59, no. 6, pp. 2791--2795, December 2012.
[3]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Adaptive Performance Compensation with In-Situ Timing Error Predictive Sensors for Subthreshold Circuits,'' IEEE Transactions on VLSI Systems, vol. 20, no. 2, pp. 333--343, February 2012.
[4]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' IEEE Transactions on Nuclear Science, vol. 58, no. 4, pp. 2097--2102, August 2011.
[5]  H. Fuketa, D. Kuroda, M. Hashimoto, and T. Onoye, ``An Average-Performance-Oriented Subthreshold Processor Self-Timed by Memory Read Completion,'' IEEE Transactions on Circuits and Systems II, vol. 58, no. 5, pp. 299--303, May 2011.
[6]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Transistor Variability Modeling and Its Validation with Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits,'' IEEE Transactions on VLSI Systems, vol. 18, no. 7, pp. 1118--1129, July 2010.
[7]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Trade-Off Analysis between Timing Error Rate and Power Dissipation for Adaptive Speed Control with Timing Error Prediction,'' IEICE Trans. Fundamentals of Electronics, Communications and Computer Sciences, vol. E92-A, no. 12, pp. 3094-3102, December 2009.
[8]  K. Hamamoto, H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``An Experimental Study on Body-Biasing Layout Style Focusing on Area Efficiency and Speed Controllability,'' IEICE Trans. on Electronics, vol. E92-C, no. 2, pp. 281-285, February 2009.
国際会議
[1]  R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, ``Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' IEEE Nuclear and Space Radiation Effects Conference, July 2012.
[2]  M. Hashimoto and H. Fuketa, ``Adaptive Performance Compensation with On-Chip Variation Monitoring (Invited),'' In Proceedings of International Midwest Symposium on Circuits and Systems (MWSCAS), August 2011.
[3]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' In Proceedings of International Reliability Physics Symposium (IRPS), pp. 213--217, May 2010.
[4]  D. Kuroda, H. Fuketa, M. Hashimoto, and T. Onoye, ``A 16-Bit Risc Processor with 4.18pj/Cycle at 0.5v Operation,'' In Proceedings of IEEE COOL Chips, p. 190, April 2010.
[5]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Adaptive Performance Control with Embedded Timing Error Predictive Sensors for Subthreshold Circuits,'' In Proc. Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 361-362, January 2010.
[6]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Adaptive Performance Compensation with In-Situ Timing Error Prediction for Subthreshold Circuits,'' In Proc. IEEE Custom Integrated Circuits Conference, pp. 215-218, September 2009.
[7]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Trade-Off Analysis between Timing Error Rate and Power Dissipation for Adaptive Speed Control with Timing Error Prediction,'' In Proc. Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 266-271, January 2009.
[8]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-Biased Circuits and Subthreshold Circuits,'' In ICCAD Colocated Workshop on Test Structure Design for Variability Characterization, November 2008.
[9]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits,'' In Proc. IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), pp. 3-8, August 2008.
[10]  K. Hamamoto, H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Experimental Study on Body-Biasing Layout Style - Negligible Area Overhead Enables Sufficient Speed Controllability -,'' In ACM Great Lakes Symposium on VLSI, pp. 387-390, May 2008.
[11]  K.Hamamoto, H.Fuketa, M.Hashimoto, Y.Mitsuyama, and T.Onoye, ``A Study on Body-Biasing Layout Style Focusing on Area Efficiency and Speed Controllability,'' In Proc. Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI 2007), pp. 233-237, October 2007.
研究会等発表論文
[1]  黒田 弾, 更田 裕司, 橋本 昌宜, 尾上 孝雄, ``低エネルギー動作に適した超低電圧プロセッサのアーキテクチャ評価,'' 情報処理学会第141回システムLSI設計技術研究会, pp107-112, October 2009.
[2]  更田 裕司, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``サブスレッショルド回路における基板バイアスを考慮したトランジスタのばらつきモデリングとリングオシレータを用いた検証,'' 信学技報, VLD2008-159, vol. 108, no. 478, pp. 201-206, March 2009.
[3]  更田 裕司, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``タイミングエラー予告を用いた適応的速度制御におけるタイミングエラー頻度と消費電力のトレードオフ解析,'' 情報処理学会DAシンポジウム, pp. 217-222, August 2008.
[4]  濱本 浩一, 更田 裕司, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``基板バイアス印加レイアウト方式の面積効率と速度制御性の評価,'' 信学技報, CAS2008-14, VLD2008-27, SIP2008-48(2008-6), pp. 75-79, June 2008.
大会等発表論文
[1]  更田 裕司, 橋本 昌宜, 密山 幸男, 尾上 孝雄, ``加算器を用いたsubthreshold 回路の設計指針の検討,'' 電子情報通信学会総合大会, A-3-17, March 2007.

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