論文誌
[1]  T. Kanamoto, T. Okumura, K. Furukawa, H. Takafuji, A. Kurokawa, K. Hachiya, T. Sakata, M. Tanaka, H. Nakashima, H. Masuda, T. Sato, and M. Hashimoto, ``Impact of Self-Heating in Wire Interconnection on Timing,'' IEICE Trans. on Electronics, vol. E93-C, no. 3, pp. 388--392, March 2010.
[2]  Z. Huang, A. Kurokawa, M. Hashimoto, T. Sato, M. Jiang, and Y. Inoue, ``Modeling the Overshooting Effect for Cmos Inverter Delay Analysis in Nanometer Technologies,'' IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems , vol. 29, no. 2, pp. 250--260, February 2010.
[3]  T. Sakata, T. Okumura, A. Kurokawa, H. Nakashima, H. Masuda, T. Sato, M. Hashimoto, K. Hachiya, K. Furukawa, M. Tanaka, H. Takafuji, and T. Kanamoto, ``An Approach for Reducing Leakage Current Variation Due to Manufacturing Variability,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E92-A, no. 12, pp. 3016--3023, December 2009.
[4]  A. Kurokawa, T. Sato, T. Kanamoto, and M. Hashimoto, ``Interconnect Modeling: a Physical Design Perspective (Invited),'' IEEE Transactions on Electron Devices, vol. 56, no. 9, pp. 1840--1851, September 2009.
[5]  T. Okumura, A. Kurokawa, H. Masuda, T. Kanamoto, M. Hashimoto, H. Takafuji, H. Nakashima, N. Ono, T. Sakata, and T. Sato, ``Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. 92-A, no. 4, pp. 990--997, April 2009.
[6]  T. Kanamoto, S. Akutsu, T. Nakabayashi, T. Ichinomiya, K. Hachiya, A. Kurokawa, H. Ishikawa, S. Muromoto, H. Kobayashi, and M Hashimoto, ``Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E89-A, no. 12, pp. 3666-3670, December 2006.
[7]  A. Kurokawa, M. Hashimoto, A. Kasebe, Z.-C. Huang, , Y. Yang, Y. Inoue, R. Inagaki, and H. Masuda, ``Second-Order Polynomial Expressions for On-Chip Interconnect Capacitance,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, vol. E88-A, no. 12, pp. 3453-3462, December 2005.
国際会議
[1]  K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Conference on Computer-Aided Design (ICCAD), pp. 47-53, November 2006.
[2]  K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 59-64, February 2006.
研究会等発表論文
[1]  新開 健一, 橋本 昌宜, 黒川 敦, 尾上孝雄, ``電流変動に着目した広範囲な製造・環境ばらつき対応ゲート遅延モデル,'' 第19回 回路とシステム軽井沢ワークショップ, pp. 559-564, April 2006.

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