国際会議
[1]  K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Conference on Computer-Aided Design (ICCAD), pp. 47-53, November 2006.
[2]  K. Shinkai, M. Hashimoto, A. Kurokawa, and T. Onoye, ``A Gate Delay Model Focusing on Current Fluctuation Over Wide-Range of Process and Environmental Variability,'' In Proc. International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), pp. 59-64, February 2006.
研究会等発表論文
[1]  新開 健一, 橋本 昌宜, 黒川 敦, 尾上孝雄, ``電流変動に着目した広範囲な製造・環境ばらつき対応ゲート遅延モデル,'' 第19回 回路とシステム軽井沢ワークショップ, pp. 559-564, April 2006.

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