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分類 国際会議
著者名 (author) T. Uemura,S. Okano,T. Kato,H. Matsuyama,M. Hashimoto
英文著者名 (author)
キー (key)
表題 (title) Soft Error Immune Latch Design for 20 nm bulk CMOS
表題 (英文)
定期刊行物名 (journal) Proceedings of International Reliability Physics Symposium (IRPS)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) April
出版年 (year) 2015
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-355]  T. Uemura, S. Okano, T. Kato, H. Matsuyama, and M. Hashimoto, ``Soft Error Immune Latch Design for 20 Nm Bulk Cmos,'' Proceedings of International Reliability Physics Symposium (IRPS), April 2015.

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    author = {T. Uemura and S. Okano and T. Kato and H. Matsuyama and M.
    Hashimoto},
    author_e = {},
    title = {Soft Error Immune Latch Design for 20 nm bulk CMOS},
    title_e = {},
    journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
    
    journal_e = {},
    volume = {},
    number = {},
    pages = {},
    month = {April},
    year = {2015},
    note = {},
    annote = {}
}

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