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分類 国際会議
著者名 (author) T. Uemura,M. Hashimoto
英文著者名 (author)
キー (key)
表題 (title) Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag
表題 (英文)
定期刊行物名 (journal) Proceedings of International Symposium on Reliability Physics (IRPS)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) April
出版年 (year) 2015
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-354]  T. Uemura and M. Hashimoto, ``Investigation of Single Event Upset and Total Ionizing Dose in Feram for Medical Electronic Tag,'' Proceedings of International Symposium on Reliability Physics (IRPS), April 2015.

@article{1_354,
    author = {T. Uemura and M. Hashimoto},
    author_e = {},
    title = {Investigation of Single Event Upset and Total Ionizing Dose in
    FeRAM for Medical Electronic Tag},
    title_e = {},
    journal = {Proceedings of International Symposium on Reliability Physics
    (IRPS)},
    journal_e = {},
    volume = {},
    number = {},
    pages = {},
    month = {April},
    year = {2015},
    note = {},
    annote = {}
}

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