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分類 国際会議
著者名 (author) T. Uemura,T. Kato,S. Okano,H. Matsuyama,M. Hashimoto
英文著者名 (author)
キー (key)
表題 (title) Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM
表題 (英文)
定期刊行物名 (journal) Proceedings of International Symposium on Reliability Physics (IRPS)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) April
出版年 (year) 2015
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-353]  T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, ``Impact of Package on Neutron Induced Single Event Upset in 20 Nm Sram,'' Proceedings of International Symposium on Reliability Physics (IRPS), April 2015.

@article{1_353,
    author = {T. Uemura and T. Kato and S. Okano and H. Matsuyama and M.
    Hashimoto},
    author_e = {},
    title = {Impact of Package on Neutron Induced Single Event Upset in 20 nm
    SRAM},
    title_e = {},
    journal = {Proceedings of International Symposium on Reliability Physics
    (IRPS)},
    journal_e = {},
    volume = {},
    number = {},
    pages = {},
    month = {April},
    year = {2015},
    note = {},
    annote = {}
}

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