Search this article in Google Scholar


分類 国際会議
著者名 (author) S. Hirokawa,R. Harada,M. Hashimoto,K. Sakuta,Y. Watanabe
英文著者名 (author)
キー (key)
表題 (title) Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation
表題 (英文)
定期刊行物名 (journal) IEEE Nuclear and Space Radiation Effects Conference (NSREC)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) July
出版年 (year) 2015
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-350]  S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, ``Neutron-Induced Seu and Mcu Rate Characterization and Analysis of Sotb and Bulk Srams at 0.3v Operation,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.

@article{1_350,
    author = {S. Hirokawa and R. Harada and M. Hashimoto and K. Sakuta and Y.
    Watanabe},
    author_e = {},
    title = {Neutron-Induced SEU and MCU Rate Characterization and Analysis of
    SOTB and Bulk SRAMs at 0.3V Operation},
    title_e = {},
    journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
    journal_e = {},
    volume = {},
    number = {},
    pages = {},
    month = {July},
    year = {2015},
    note = {},
    annote = {}
}

This site is maintained by Onoye Lab.

PMAN 2.5.5 - Paper MANagement system / (C) 2002-2008, Osamu Mizuno / All rights reserved.