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分類 国際会議
著者名 (author) T. Uemura,T. Kato,R. Tanabe,H. Iwata,H. Matsuyama,M. Hashimoto,K. Takahisa,M. Fukuda,K. Hatanaka
英文著者名 (author)
キー (key)
表題 (title) Preventing Single Event Latchup with Deep P-well on P-substrate
表題 (英文)
定期刊行物名 (journal) Proceedings of International Reliability Physics Symposium (IRPS)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) June
出版年 (year) 2014
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-338]  T. Uemura, T. Kato, R. Tanabe, H. Iwata, H. Matsuyama, M. Hashimoto, K. Takahisa, M. Fukuda, and K. Hatanaka, ``Preventing Single Event Latchup with Deep P-Well on P-Substrate,'' Proceedings of International Reliability Physics Symposium (IRPS), June 2014.

@article{1_338,
    author = {T. Uemura and T. Kato and R. Tanabe and H. Iwata and H. Matsuyama
    and M. Hashimoto and K. Takahisa and M. Fukuda and K. Hatanaka},
    author_e = {},
    title = {Preventing Single Event Latchup with Deep P-well on P-substrate},
    title_e = {},
    journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
    
    journal_e = {},
    volume = {},
    number = {},
    pages = {},
    month = {June},
    year = {2014},
    note = {},
    annote = {}
}

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