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分類 国際会議
著者名 (author) Y. Higuchi,K. Shinkai,M. Hashimoto,R. Rao,S. Nassif
英文著者名 (author)
キー (key)
表題 (title) Extracting Device-Parameter Variations using a Single Sensitivity-Configurable Ring Oscillator
表題 (英文)
定期刊行物名 (journal) Proceedings of IEEE European Test Symposium (ETS)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 106--111
刊行月 (month) May
出版年 (year) 2013
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-322]  Y. Higuchi, K. Shinkai, M. Hashimoto, R. Rao, and S. Nassif, ``Extracting Device-Parameter Variations Using a Single Sensitivity-Configurable Ring Oscillator,'' Proceedings of IEEE European Test Symposium (ETS), pp. 106--111, May 2013.

@article{1_322,
    author = {Y. Higuchi and K. Shinkai and M. Hashimoto and R. Rao and S.
    Nassif},
    author_e = {},
    title = {Extracting Device-Parameter Variations using a Single Sensitivity-
    Configurable Ring Oscillator},
    title_e = {},
    journal = {Proceedings of IEEE European Test Symposium (ETS)},
    journal_e = {},
    volume = {},
    number = {},
    pages = {106--111},
    month = {May},
    year = {2013},
    note = {},
    annote = {}
}

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