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分類 国際会議
著者名 (author) T. Uemura,T. Kato,H. Matsuyama,M. Hashimoto
英文著者名 (author)
キー (key)
表題 (title) Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor reliability on Bulk CMOS Technology
表題 (英文)
定期刊行物名 (journal) IEEE Nuclear and Space Radiation Effects Conference (NSREC)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) July
出版年 (year) 2013
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-317]  T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Scaling Trend of Sram and Ff of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk Cmos Technology,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.

@article{1_317,
    author = {T. Uemura and T. Kato and H. Matsuyama and M. Hashimoto},
    author_e = {},
    title = {Scaling Trend of SRAM and FF of Soft-Error Rate and Their
    Contribution to Processor reliability on Bulk CMOS Technology},
    title_e = {},
    journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
    journal_e = {},
    volume = {},
    number = {},
    pages = {},
    month = {July},
    year = {2013},
    note = {},
    annote = {}
}

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