Search this article in Google Scholar


分類 国際会議
著者名 (author) H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key)
表題 (title) Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
表題 (英文)
書籍・会議録表題 (booktitle) Proceedings of International Reliability Physics Symposium (IRPS)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 213--217
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) May
出版年 (year) 2010
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル Not available.


[1-247]  H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10t Subthreshold Sram,'' In Proceedings of International Reliability Physics Symposium (IRPS), pp. 213--217, May 2010.

@inproceedings{1_247,
    author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
    author_e = {},
    editor = {},
    editor_e = {},
    title = {Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-
    nm 10T Subthreshold SRAM},
    title_e = {},
    booktitle = {Proceedings of International Reliability Physics Symposium
    (IRPS)},
    booktitle_e = {},
    volume = {},
    number = {},
    pages = {213--217},
    organization = {},
    publisher = {},
    publisher_e = {},
    address = {},
    month = {May},
    year = {2010},
    note = {},
    annote = {}
}

This site is maintained by Onoye Lab.

PMAN 2.5.5 - Paper MANagement system / (C) 2002-2008, Osamu Mizuno / All rights reserved.